Balanced homodyne detection in second-harmonic generation microscopy
光学
2016-08-16 v2
摘要
We demonstrate the association of two-photon nonlinear microscopy with balanced homodyne detection for investigating second harmonic radiation properties at nanoscale dimensions. Variation of the relative phase between second-harmonic and fundamental beams is retrieved, as a function of the absolute orientation of the nonlinear emitters. Sensitivity down to approximately 3.2 photon/s in the spatio-temporal mode of the local oscillator is obtained. This value is high enough to efficiently detect the coherent second-harmonic emission from a single KTiOPO4 crystal of sub-wavelength size.
引用
@article{arxiv.physics/0604125,
title = {Balanced homodyne detection in second-harmonic generation microscopy},
author = {Loc Le Xuan and François Marquier and Dominique Chauvat and Sophie Brasselet and François Treussart and Sandrine Perruchas and Cédric Tard and Thierry Gacoin and Jean-François Roch},
journal= {arXiv preprint arXiv:physics/0604125},
year = {2016}
}
备注
9 pages to appear in Applied Physics Letters