English

Abrupt p-n junction using ionic gating at zero-bias in bilayer graphene

Mesoscale and Nanoscale Physics 2017-06-15 v1

Abstract

Graphene is a promising candidate for optoelectronic applications. In this report, a double gated bilayer graphene FET has been made using a combination of electrostatic and electrolytic gating in order to form an abrupt p-n junction. The presence of two Dirac peaks in the gating curve of the fabricated device confirms the formation of a p-n junction. At low temperatures, when the electrolyte is frozen intentionally, the photovoltage exhibits a six-fold pattern indicative of the hot electron induced photothermoelectric effect that has also been seen in graphene p-n junctions made using metallic gates. We have observed that the photovoltage increases with decreasing temperature indicating a dominant role of supercollision scattering. Our technique can also be extended to other 2D materials and to finer features that will lead to p-n junctions which span a large area, like a superlattice, that can generate a larger photoresponse. Our work creating abrupt p-n junctions is distinct from previous works that use a source-drain bias voltage with a single ionic gate creating a spatially graded p-n junction.

Keywords

Cite

@article{arxiv.1706.04328,
  title  = {Abrupt p-n junction using ionic gating at zero-bias in bilayer graphene},
  author = {Sameer Grover and Anupama Joshi and Ashwin Tulapurkar and Mandar M. Deshmukh},
  journal= {arXiv preprint arXiv:1706.04328},
  year   = {2017}
}
R2 v1 2026-06-22T20:18:14.632Z