一种由应力诱发的声子爆发与准粒子中毒源
仪器与探测器
2024-08-16 v2 超导电性
摘要
超导量子比特的性能被一组表征不佳的、破坏负责超导性的库珀对的能量源所退化，造成常称为“准粒子中毒”的状况。超导量子比特和低阈值暗物质量热计都观测到过量的准粒子或声子爆发，其速率随时间下降。在此我们展示，粘接到其支架上的硅晶体所表现出的低能声子事件速率，比处于低应力状态、以相同方式悬置于支架上的功能相同晶体高出两个数量级以上。粘接晶体中过量的声子事件速率自降温以来随时间下降，与一种声子爆发源一致，该源导致了量子电路中的准粒子中毒以及低温量热计中观测到的低能事件。我们认为，胶层与晶体之间热致应力的弛豫是这些事件的来源。
引用
@article{arxiv.2208.02790,
title = {A Stress Induced Source of Phonon Bursts and Quasiparticle Poisoning},
author = {Robin Anthony-Petersen and Andreas Biekert and Raymond Bunker and Clarence L. Chang and Yen-Yung Chang and Luke Chaplinsky and Eleanor Fascione and Caleb W. Fink and Maurice Garcia-Sciveres and Richard Germond and Wei Guo and Scott A. Hertel and Ziqing Hong and Noah Kurinsky and Xinran Li and Junsong Lin and Marharyta Lisovenko and Rupak Mahapatra and Adam Mayer and Daniel N. McKinsey and Siddhant Mehrotra and Nader Mirabolfathi and Brian Neblosky and William A. Page and Pratyush K. Patel and Bjoern Penning and H. Douglas Pinckney and Mark Platt and Matt Pyle and Maggie Reed and Roger K. Romani and Hadley Santana Queiroz and Bernard Sadoulet and Bruno Serfass and Ryan Smith and Peter F. Sorensen and Burkhant Suerfu and Aritoki Suzuki and Ryan Underwood and Vetri Velan and Gensheng Wang and Yue Wang and Samuel L. Watkins and Michael R. Williams and Volodymyr Yefremenko and Jianjie Zhang},
journal= {arXiv preprint arXiv:2208.02790},
year = {2024}
}
备注
19 pages (main + supplementary), 6 figures. W. A. Page and R. K. Romani contributed equally to this work. Correspondence should be addressed to R. K. Romani