Related papers: Crosstalk Correction in Atomic Force Microscopy
LSST's compact, low power focal plane will be subject to electronic crosstalk with some unique signatures due to its readout geometry. This note describes the crosstalk mechanisms, ongoing characterization of prototypes, and implications…
The possibility of the mechanical detection of the Casimir friction using the non-contact force microscope is discussed. On a SiO2 tip situated above a graphene-covered SiO2 substrate will act the frictional drag force mediated by a…
We present an experimental investigation of coherent crosstalk cancellation methods for light delivered to a linear ion chain cryogenic quantum register. The ions are individually addressed using focused laser beams oriented perpendicular…
We investigated insulating Cu$_2$N islands grown on Cu(100) by means of combined scanning tunneling microscopy and atomic force microscopy with two vastly different tips: a bare metal tip and a CO-terminated tip. We use scanning tunneling…
Atomic Force Microscopy (AFM) conventional static force curves and Force Feedback Microscopy (FFM) force curves acquired with the same cantilever at the solid/air and solid/liquid interfaces are here compared. The capability of the FFM to…
In order to pursue high-precision beam position measurements for the free-electron laser (FEL) facilities, cavity beam position monitor (CBPM) is employed to measure the transverse position which can meet the requirement of position…
We report here that atomic force microscope (AFM) in frictional force mode can be used to detect onset of chain scission and crosslinking in polymeric and macromolecular samples upon irradiation. A systematic investigation to detect chain…
In this paper, a dynamic model of reconstruction of the shear force $g(t)$ in the Atomic Force Microscopy (AFM) cantilever tip-sample interaction is proposed. The interaction of the cone-shaped cantilever tip with the surface of the…
Four-dimensional scanning transmission electron microscopy (4D-STEM) of local atomic diffraction patterns is emerging as a powerful technique for probing intricate details of atomic structure and atomic electric fields. However, efficient…
We present a contactless method for measuring the elastic modulus of living cells (human triple-negative breast cancer, MDA-MB-231) from the thermal fluctuations of an atomic force microscope (AFM) cantilever. By analyzing the power…
The effects of the tilt of the crystallographic orientation with respect to an incident electron probe on high-angle annular dark field (HAADF) imaging in aberration-corrected scanning transmission electron microscopy (STEM) have been…
Photoacoustic detection is a sensitive method for measurement of light-absorbing particles directly in the aerosol phase. In this article, we demonstrate a new sensitive technique for photoacoustic aerosol absorption measurements using a…
We show that functionalized micromechanical bilayer levers can be used as sensitive probes to accurately measure radiative heat flux in vacuum between two materials at the micro scale. By means of calibration to one material these…
Optical beam deflection is a popular method to measure the deformation of micromechanical devices. As it measures mostly a local slope, its sensitivity depends on the location and size of the optical spot. We present a method to evaluate…
We study a model of a magnetic resonance force microscope (MRFM) based on the cyclic adiabatic inversion technique as a high-resolution tool to detect single electron spins. We investigate the quantum dynamics of spin and cantilever in the…
The use of atomic force microscopy on nanomechanical measurements requires accurate calibration of the cantilever's spring constant ($k_c$) and the optical lever sensitivity ($OLS$). The thermal method, based on the cantilever's thermal…
Accurate measurements of the nanoscale electromechanical coupling in materials, including piezo and ferroelectrics, twisted 2D layers, and biological systems is of both fundamental scientific and applied importance. Piezoresponse Force…
Magnetography using magnetic sensitive lines is regarded traditionally as the main instrument for measuring the magnetic field of the whole Sun. Full polarized Stockes parameters ($I$, $Q$, $U$, $V$) observed can be used to deduce the…
Electron tomography offers important three-dimensional (3D) structural information which cannot be observed by two-dimensional imaging. By combining annular dark field scanning transmission electron microscopy (ADF-STEM) with aberration…
Atomic-resolution scanning transmission electron microscopy (STEM) characterization requires precise tilting of the specimen to high symmetric zone axis, which is usually processed in reciprocal space by following the diffraction patterns.…