Related papers: Crosstalk Correction in Atomic Force Microscopy

Mesoscopic systems possess shot noise in their currents due to the quantization of the conducting quasiparticles. Measurements of this shot noise are useful to study phenomena that do not manifest themselves in standard conductance or…

Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable…

A dual-excitation method for resonant-frequency tracking in scanning probe microscopy based on amplitude detection is developed. This method allows the cantilever to be operated at or near resonance for techniques where standard phase…

Amplitude-modulation atomic force microscopy (AM-AFM) measures nanoscale surface structures by detecting changes in the cantilever oscillation amplitude, contributing to materials research. AM-AFM can non-destructively observe fragile…

Atomic Force Microscopy (AFM) allows to probe matter at atomic scale by measuring the perturbation of a nanomechanical oscillator induced by near-field interaction forces. The quest to improve sensitivity and resolution of AFM has forced…

Atomic force microscopy (AFM) enables nanoscale characterization and has been widely applied to a broad range of systems. Over the past two decades, advances in high-speed AFM have enabled not only the imaging of static structures but also…

We demonstrate coaxial atomic force microscope (AFM) tweezers that can trap and place small objects using dielectrophoresis (DEP). An attractive force is generated at the tip of a coaxial AFM probe by applying a radio frequency voltage…

Quality factor plays a fundamental role in dynamic mode atomic force microscopy. We present a technique to modify the quality factor of an atomic force microscopy cantilever within a Fabry-P\'erot optical interferometer. The experimental…

We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever…

In an electromechanical which-path device electrons travelling through an Aharonov-Bohm ring with a quantum dot in one of the arms are dephased by an interaction with the fundamental flexural mode of a radio-frequency cantilever, leading to…

A major impediment to a more complete understanding of barrier crossing and other single-molecule processes is the inability to directly visualize the trajectories and dynamics of atoms and molecules in reactions. Rather, the kinetics are…

Colloidal probes are often used in force microscopy when the geometry of the tip-sample interaction should be well controlled. Their calibration requires the understanding of their mechanical response, which is very sensitive to the details…

Infrared interferometers are optical devices that can measure optical path-length differences by measuring changes in the refractive index. Several arrangements can be deployed, from single channel devices to multichannel double color…

Imaging energy filters in photoelectron microscopes and momentum microscopes use spherical fields with deflection angles of 90{\deg}, 180{\deg}, and even 2 x 180{\deg}. These instruments are optimized for high energy resolution, but exhibit…

The total photodetachment cross section of a linear triatomic anion is derived for arbitrary laser polarization direction. The cross section is shown to be strongly oscillatory when the laser polarization direction is parallel to the axis…

An electrostatic hexapole lens is used to manipulate the transverse properties of a beam of barium fluoride molecules from a cryogenic buffer gas source. The spatial distribution of the beam is measured by recording state-selective…

Noncontact atomic force microscopy (NC-AFM) and Kelvin probe force microscopy (KPFM) have become important tools for nanotechnology; however, their contrast mechanisms on the atomic scale are not entirely understood. Here we used chlorine…

Forces acting between an Atomic Force Microscope (AFM) tip and sample are three dimensional. Despite this, most AFM force measurements are confined to one or two dimensions. Extending AFM force measurements into three dimensions has…

Interatomic-force measurements are regularly performed using frequency-modulation atomic force microscopy. This requires conversion of the observed shift in the resonant frequency of a force-sensing cantilever, to the actual force…

The qPlus sensor allows simultaneous measurements of scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Its design for use in frequency modulation AFM (FM-AFM) involves separate electrodes, applied on an oscillating…