Related papers: Crosstalk Correction in Atomic Force Microscopy
An atomic force microscope (AFM) is capable of producing ultra-high resolution measurements of nanoscopic objects and forces. It is an indispensable tool for various scientific disciplines such as molecular engineering, solid-state physics,…
We demonstrate high-fidelity detection of the orbital angular momentum (OAM) of light using a compact and practical OAM spectrometer that maps the OAM spectrum to time. The spectrometer consists of a single optical delay loop to achieve…
Images obtained by drift-scanning with a stationary telescope are affected by the declination-dependent curvature of star trails. The image displacement to curvature and drift rate variation increases with the angular field of view and can…
We describe a novel application of atomic force microscopy (AFM) to directly visualize cytoskeletal fibers in human foreskin epithelial cells. The nonionic detergent Triton X-100 in a low concentration was used to remove the membrane,…
Dynamic-mode atomic force microscopy (AFM) in liquid remains complicated due to the strong viscous damping of the cantilever resonance. Here we show that a high-quality resonance (Q>20) can be achieved in aqueous solution by attaching a…
Aberration corrected scanning transmission electron microscopes (STEM) enable to determine local strain fields, composition and bonding states at atomic resolution. The precision to locate atomic columns is often obstructed by scan…
Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip-surface force by measurement of the mixing of multiple tones in a frequency comb. A high $Q$ cantilever resonance and…
Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe forming lens. Now atomic-sized beams are routine, even at accelerating voltages as…
Atomic force microscope (AFM) generally works on the basis of manipulating absolute magnitude of van der Waals (vdW) force between the tip and specimen. The force is, however, less sensitive to alternation of atom species than to tip-sample…
Directed atomic fabrication using an aberration-corrected scanning transmission electron microscope (STEM) opens new pathways for atomic engineering of functional materials. In this approach, the electron beam is used to actively alter the…
Individual electron spins have been observed using magnetic resonance in combination with a number of distinct detection approaches. The coordinates of an individual electron spin can then in principle be determined by introducing a 10 to…
It is known that line optical tweezers (LOT) can measure potential of mean force (PMF) between colloidal particles in the bulk. However, PMF obtained with LOT is empirically modified before showing the result of the final form in order to…
Orbital angular momentum (OAM) of photons is carried upon the wave front of an optical vortex and is important in physics research due to its fundamental degree of freedom. As for the interaction with materials, the optical OAM was shown to…
A photonic force microscope comprises of an optically trapped micro-probe and a position detection system to track the motion of the probe. Signal collection for motion detection is often carried out using the backscattered light off the…
In a previous work, we designed a compact atom interferometer to measure homogeneous constant forces guiding the arms via shortcuts to adiabatic paths. Within this scheme we drive the atom by moving spin-dependent traps, and design a force…
We report a new experimental technique for Kelvin probe force microscopy (KPFM) using the dissipation signal of frequency modulation atomic force microscopy for bias voltage feedback. It features a simple implementation and faster scanning…
Conventional dynamic atomic force microscopy (AFM) can be extended to bimodal and multimodal AFM in which the cantilever is simultaneously excited at two ore more resonance frequencies. Such excitation schemes result in one additional…
Optical detection back-action in cantilever resonant or static detection presents a challenge when striving for state-of-the-art performance. The origin and possible routes for minimizing optical back-action have received little attention…
Virtually all commercial instruments for the measurement of the oscillator PM noise make use of the Cross Spectrum method (arXiv:1004.5539 [physics.ins-det], 2010). High sensitivity is achieved by correlation and averaging on two equal…
Unwanted motion of the probe with respect to the sample is a ubiquitous problem in scanning probe microscopy, causing both linear and nonlinear artifacts in experimental images. We have designed a procedure to correct these artifacts by…