Unwanted motion of the probe with respect to the sample is a ubiquitous problem in scanning probe microscopy, causing both linear and nonlinear artifacts in experimental images. We have designed a procedure to correct these artifacts by using orthogonal scan pairs to align each measurement line-by-line along the slow scan direction. We demonstrate the accuracy of our algorithm on both synthetic and experimental data and provide an implementation of our method.
@article{arxiv.1507.00320,
title = {Correcting nonlinear drift distortion of scanning probe microscopy from image pairs with orthogonal scan directions},
author = {Colin Ophus and Chris T Nelson and Jim Ciston},
journal= {arXiv preprint arXiv:1507.00320},
year = {2015}
}
Comments
10 pages, 6 figures, LINK to supplementary material