Emissivity measurements with an Atomic Force Microscope
Mesoscale and Nanoscale Physics
2015-06-03 v1 Instrumentation and Detectors
Abstract
We show that functionalized micromechanical bilayer levers can be used as sensitive probes to accurately measure radiative heat flux in vacuum between two materials at the micro scale. By means of calibration to one material these measurements can be made quantitative for radiative heat flux or for either temperature or material emissivity. We discuss issues and opportunities for our method and provide ample technical details regarding its implementation and demonstrate good correspondence with the Stefan Boltzman law. We use this system to probe the phase transition of VO2 and find that radiative heat transfer in farfield between VO2 and glass can be reversibly modulated by a factor of 5.
Cite
@article{arxiv.1111.1193,
title = {Emissivity measurements with an Atomic Force Microscope},
author = {Pieter Jan van Zwol and Laurent Ranno and Joel Chevrier},
journal= {arXiv preprint arXiv:1111.1193},
year = {2015}
}
Comments
14 pages 10 figures