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We report a direct correlation between carrier mobility and Raman topography of epitaxial graphene (EG) grown on silicon carbide (SiC). We show the Hall mobility of material on the Si-face of SiC [SiC(0001)] is not only highly dependent on…

The discovery of two-dimensional electron gases (2DEGs) at the interface between two insulating complex oxides, such as LaAlO3 (LAO) or gamma-Al2O3 (GAO) epitaxially grown on SrTiO3 (STO) 1,2, provides an opportunity for developing…

We study electron transport in monolayer molybdenum disulfide MoS$_2$ subjected to a magnetic barrier. Our analysis employs a full-band continuum model to capture the relevant physical phenomena. We focus on how electron energy, magnetic…

Mesoscale and Nanoscale Physics · Physics 2025-07-16 Ahmed Jellal , Nadia Benlakhouy , Pablo Díaz , David Laroze

Strain plays a critical role in the properties of materials. In silicon and silicon-germanium, strain provides a mechanism for control of both carrier mobility and band offsets. In materials integra-tion, strain is typically tuned through…

Dynamic Monte Carlo simulations are used to study coupled transport (co-transport) through sub-nanometer-diameter pores. In this classic Hodgkin-Keynes mechanism, an ion species uses the large flux of an abundant ion species to move against…

Soft Condensed Matter · Physics 2013-11-27 Dezső Boda , Éva Csányi , Dirk Gillespie , Tamás Kristóf

Surface states of topological insulators (TIs) have been playing the central role in the majority of outstanding investigations in low-dimensional electron systems for more than 10 years. TIs based on high-quality strained HgTe films…

Mesoscale and Nanoscale Physics · Physics 2019-05-15 M. L. Savchenko , D. A. Kozlov , N. N. Vasilev , Z. D. Kvon , N. N. Mikhailov , S. A. Dvoretsky , A. V. Kolesnikov

The influence of electron-electron scattering on the distribution function and transport characteristics of intrinsic monolayer graphene is investigated via an ensemble Monte Carlo simulation. Due to the linear dispersion relation in the…

Mesoscale and Nanoscale Physics · Physics 2010-05-18 X. Li , E. A. Barry , J. M. Zavada , M. Buongiorno Nardelli , K. W. Kim

The effects of surface polar phonons on electronic transport properties of monolayer graphene are studied by using a Monte Carlo simulation. Specifically, the low-field electron mobility and saturation velocity are examined for different…

Mesoscale and Nanoscale Physics · Physics 2015-05-20 X. Li , E. A. Barry , J. M. Zavada , M. Buongiorno Nardelli , K. W. Kim

Extensive theoretical and experimental work has established high-fidelity electron shuttling in Si/SiGe systems, whereas demonstrations in Si/SiO2 (SiMOS) remain at an early stage. To help address this, we perform full 3D simulations of…

Quantum Physics · Physics 2026-04-21 Jack J. Turner , Christian W. Binder , Guido Burkard , Andrew J. Fisher

Current advancements in battery technologies require electrodes to combine high-performance active material such as Silicon (Si) with two-dimensional materials such as transition metal carbides (MXenes) for prolonged cycle stability and…

Applied Physics · Physics 2023-07-14 Vidushi Sharma , Dibakar Datta

Ideal, completely coherent quantum transport calculations had predicted that superlattice MOSFETs may offer steep subthreshold swing performance below 60mV/dec to around 39mV/dec. However, the high carrier density in the superlattice source…

Mesoscale and Nanoscale Physics · Physics 2016-12-13 Pengyu Long , Jun Huang , Zhengping Jiang , Gerhard Klimeck , Mark J. W. Rodwell , Michael Povolotskyi

The electronic transport properties of a series of LaAlO_3 / SrTiO_3 interfaces were investigated, and a systematic thickness dependence of the sheet resistance and magnetoresistance was found for constant growth conditions. This trend…

Strongly Correlated Electrons · Physics 2015-05-13 C. Bell , S. Harashima , Y. Hikita , H. Y. Hwang

We have measured the Shubnikov-de Haas oscillations in high-mobility Si MOS structures over a wide range of the carrier densities n > 0.77x10^{11}/cm^2. This range includes the critical density n_c of the metal-insulator transition (2D MIT)…

Strongly Correlated Electrons · Physics 2007-05-23 V. M. Pudalov , M. E. Gershenson , H. Kojima

This paper is concerned with a theoretical analysis of the behavior of optically excited spin currents in bilayer and multilayer systems of ferromagnetic and normal metals. As the propagation, control and manipulation of the spin currents…

Mesoscale and Nanoscale Physics · Physics 2023-08-16 J. Briones , M. Weber , B. Stadtmüller , H. C. Schneider , B. Rethfeld

We report measurements and Monte Carlo simulations of thermal conductivity of porous 100nm- thick silicon membranes, in which size, shape and position of the pores were varied randomly. Measurements using 2-laser Raman thermometry on both…

We consider quasi-two-dimensional gas of electrons in a typical Si-MOSFET, assuming repulsive contact interaction between electrons. Magnetisation and susceptibility are evaluated within the mean-field approach. Finite thickness of the…

Mesoscale and Nanoscale Physics · Physics 2017-06-28 D. I. Golosov

Three-dimensional (3D) topological insulators (TIs) are known to carry 2D Dirac-like topological surface states in which spin-momentum locking prohibits backscattering. When thinned down to a few nanometers, the hybridization between the…

Strain provides an effective means to tune the electrical properties while retaining the native chemical composition of the material. Unlike three-dimensional solids, two-dimensional materials withstand higher levels of elastic strain…

Mesoscale and Nanoscale Physics · Physics 2020-04-14 Ashby Phillip John , Arya Thenapparambil , Madhu Thalakulam

We study the effect of electron-electron interaction on the surface resistivity of three-dimensional (3D) topological insulators. In the absence of umklapp scattering, the existence of the Fermi-liquid ($T^2$) term in resistivity of a…

Materials Science · Physics 2016-03-08 H. K. Pal , V. I. Yudson , D. L. Maslov

We present an electron spin resonance (ESR) approach to characterize shallow electron trapping in band-tail states at Si/SiO2 interfaces in metal-oxide-semiconductor (MOS) devices and demonstrate it on two MOS devices fabricated at…