Thickness dependence of the mobility at the LaAlO_3 / SrTiO_3 interface

C. Bell; S. Harashima; Y. Hikita; H. Y. Hwang

doi:10.1063/1.3149695

Thickness dependence of the mobility at the LaAlO_3 / SrTiO_3 interface

Strongly Correlated Electrons 2015-05-13 v1

Authors: C. Bell , S. Harashima , Y. Hikita , H. Y. Hwang

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Abstract

The electronic transport properties of a series of LaAlO_3 / SrTiO_3 interfaces were investigated, and a systematic thickness dependence of the sheet resistance and magnetoresistance was found for constant growth conditions. This trend occurs above the critical thickness of four unit cells, below which the LaAlO_3 / SrTiO_3 interface is not conducting. A dramatic decrease in mobility of the electron gas of nearly two orders of magnitude was observed with increasing LaAlO_3 thickness from five to 25 unit cells.

Keywords

LaAlO₃/SrTiO₃ interface mobility thickness dependence sheet resistance magnetoresistance critical thickness two-dimensional electron gas

Cite

@article{arxiv.0902.3535,
  title  = {Thickness dependence of the mobility at the LaAlO_3 / SrTiO_3 interface},
  author = {C. Bell and S. Harashima and Y. Hikita and H. Y. Hwang},
  journal= {arXiv preprint arXiv:0902.3535},
  year   = {2015}
}

Comments

3 pages, 4 figures, submitted for publication

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