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Related papers: Extending Reflectometry Range, A Zero-Crossing Alg…

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Reflection at relativistically moving plasma mirrors is a well-known approach for frequency conversion as an alternative to nonlinear techniques. A key issue with plasma mirrors is the need for a high carrier concentration, of order 10^21…

There is immense scientific interest in the properties of resonant thin films embroidered with periodic nanoscale features. This device class possesses considerable innovation potential. Accordingly, we report unpolarized broadband…

Optics · Physics 2016-01-08 Manoj Niraula , Robert Magnusson

New propagation regimes for light arise from the ability to tune the dielectric permittivity to extremely low values. Here we demonstrate a universal approach based on the low linear permittivity values attained in the epsilon-near-zero…

Reflection removal technology plays a crucial role in photography and computer vision applications. However, existing techniques are hindered by the lack of high-quality in-the-wild datasets. In this paper, we propose a novel paradigm for…

Computer Vision and Pattern Recognition · Computer Science 2025-06-11 Kangning Yang , Ling Ouyang , Huiming Sun , Jie Cai , Lan Fu , Jiaming Ding , Chiu Man Ho , Zibo Meng

Mask-based lensless imagers use simple optics and computational reconstruction to design compact form factor cameras with compressive imaging ability. However, these imagers generally suffer from poor reconstruction quality. Here, we…

To design semiconductor-based optical devices, the optical properties of the used semiconductor materials must be precisely measured over a large band. Transmission spectroscopy stands out as an inexpensive and widely available method for…

Reflective ptychography is a promising lensless imaging technique with a wide field of view, offering significant potential for applications in semiconductor manufacturing and detection. However, many semiconductor materials are coated with…

Optics · Physics 2025-01-03 Yun Gao , Qijun You , Peixiang Lu , Wei Cao

This article presents a new optical measurement method employing a HSI (Hue, Saturation and Intensity) colour model to form trapezoidal structured patterns for morphology reconstruction of a measured object at a high speed. Profilometry on…

Optics · Physics 2015-05-19 L C Chen , X L Nguyen , Y S Shu

Total Internal Reflection Microscopy (TIRM) is a sensitive non-invasive technique to measure the interaction potentials between a colloidal particle and a wall with femtonewton resolution. The equilibrium distribution of the particle-wall…

Transient field-resolved spectroscopy enables studies of ultrafast dynamics in molecules, nanostructures, or solids with sub-cycle resolution, but previous work has so far concentrated on extracting the dielectric response at frequencies…

How to make a material anti-reflective without changing its high refraction index? Achieving anti-reflection in high-refractive-index materials poses challenges due to their high reflectivity (Fresnel equations). Based on theory with new…

Optics · Physics 2024-08-12 V. Gareyan , N. Margaryan , Zh. Gevorkian

Historically, spectroscopic techniques have been essential for studying the optical properties of thin solid films. However, existing formulae for both normal transmission and reflection spectroscopy often rely on simplified theoretical…

Time-domain thermoreflectance (TDTR) is a powerful technique for characterizing the thermal properties of layered materials. However, its effectiveness at modulation frequencies below 0.1 MHz is hindered by pulse accumulation effects,…

Recently, terahertz (THz) communication has drawn considerable attention as one of the promising technologies for the future wireless communications owning to its ultra-wide bandwidth. Nonetheless, one major obstacle that prevents the…

Information Theory · Computer Science 2020-09-15 Wanming Hao , Gangcan Sun , Ming Zeng , Zhengyu Zhu , Zheng Chu , Octavia A. Dobre , Pei Xiao

Fundamentally new technology is described for constructing low areal mass density (1kg/m^2), high precision (< 10micron RMS) reflectors scalable to large apertures (10 to 20 meters) for use as the primary element of a telescope system. A…

Astrophysics · Physics 2009-09-25 Mark Dragovan

Over the past decade, reflection matrix microscopy (RMM) and advanced image reconstruction algorithms have emerged to address the fundamental imaging depth limitations of optical microscopy in thick biological tissues and complex media. In…

Optics · Physics 2024-07-03 Sungsam Kang , Seokchan Yoon , Wonshik Choi

A new approach was proposed to accurately determine the thickness of film, especially for ultra-thin film, through spectrum fitting with the assistance of interference layer. The determination limit can reach even less than 1 nm. Its…

Optics · Physics 2016-06-20 Xingxing Liu , Shao-Wei Wang , Hui Xia , Xutao Zhang , Ruonan Ji , Tianxin Li , Wei Lu

Traditional imaging systems, such as the eye or cameras, image scenes that lie in the direct line-of-sight (LoS). Most objects are opaque in the optical and infrared regimes and can limit dramatically the field of view (FoV). Current…

Optics · Physics 2022-05-11 Yiran Cui , Georgios C. Trichopoulos

We present a high-resolution microwave spectrometer to measure the frequency-dependent complex conductivity of a superconducting thin film near the critical temperature. The instrument is based on a broadband measurement of the complex…

Superconductivity · Physics 2009-11-13 H. Kitano , T. Ohashi , A. Maeda

Non-intrusive displacement measurement technique has a distinct edge over displacement sensors working in contact mode. Laser Doppler Vibrometry based schemes (LDV) offer such an advantage. However, the measurements are limited up to…

Instrumentation and Detectors · Physics 2020-02-17 Nikhil Kumar Pachisia , Kajal Tiwari , Ritwick Das