Related papers: Extending Reflectometry Range, A Zero-Crossing Alg…
Terahertz imaging holds great potential for non-destructive material inspection, but practical implementation has been limited by resolution constraints. In this study, we present a single-pixel THz imaging system based on a confocal…
The increasing need of restoring high-resolution Hyper-Spectral (HS) images is determining a growing reliance on Computer Vision-based processing to enhance the clarity of the image content. HS images can, in fact, suffer from degradation…
We present a metamaterial-based terahertz (THz) sensor for thickness measurements of subwavelength-thin materials and refractometry of liquids and liquid mixtures. The sensor operates in reflection geometry and exploits the frequency shift…
The accurate modeling of reflection coefficients is pivotal for developing reliable channel models in emerging terahertz (THz) communications. This study establishes a 300$\sim$400 GHz channel measurement platform to measure the reflection…
Large Vision-Language Models (LVLMs) demonstrate remarkable performance in short-video tasks such as video question answering, but struggle in long-video understanding. The linear frame sampling strategy, conventionally used by LVLMs, fails…
We demonstrate applications of a novel scheme which is used for measuring refractive index and thickness of thin film by analyzing the relative phase difference and reflected ratio at reflection point of a monolithic folded Fabry-Perot…
When the thickness of the layer is smaller than the electrons mean free path, the morphology affects the conductivity directly based on the layer thickness. This issue provides basis in order to estimate the thickness of the layer by…
High throughput experimental methods are known to accelerate the rate of research, development, and deployment of electronic materials. For example, thin films with lateral gradients in composition, thickness, or other parameters have been…
In semiconductor manufacturing processes, silicon dioxide films are commonly used as barrier layers, insulating layers, and protective layers. Coherence scanning interferometry (CSI) offers thin film thickness measurements with a…
While a linear growth behavior is one of the fingerprints of textbook atomic layer deposition processes, the growth often deviates from that behavior in the initial regime, i.e. the first few cycles of a process. To properly understand the…
We report on the development of transmission-line reflectionless filters operating with passbands at 100 GHz and 230 GHz, and stopband absorption up to 500 GHz, the highest operating frequencies yet recorded for such filters. The designs…
This work discusses an extension to conventional low-coherence interferometry by the introduction of dispersion-encoding. The extension facilitates the measurement of surface height profiles with sub-nm resolution. The selection of a…
Image projection through scattering media has applications ranging from light delivery through multimode fiber to near-eye displays. Conventional methods utilize the transmission matrix (TM) measured by interfering with a reference beam.…
THz time domain spectroscopy is a powerful technique enabling the investigation of different materials in the far-infrared frequency range. Even if nowadays this technique is well established, its application to very thin films remains…
Bistatic radar measurements offer unique spatial diversity and enhanced target characterization capabilities, rendering them increasingly vital for contemporary sensing application research. The reliability of such measurements is…
Thermoreflectance methods by picosecond pulse heating and by nanosecond pulse heating have been developed under the same geometrical configuration as the laser flash method by the National Metrology Institute of JAPAN, AIST. Using these…
Aligning a lens system relative to an imager is a critical challenge in camera manufacturing. While optimal alignment can be mathematically computed under ideal conditions, real-world deviations caused by manufacturing tolerances often…
We describe quantitative imaging of the sheet resistance of metallic thin films by monitoring frequency shift and quality factor in a resonant scanning near-field microwave microscope. This technique allows fast acquisition of images at…
Dynamic thin film interferometry is a technique used to non-invasively characterize the thickness of thin liquid films. Recovering the underlying thickness from the captured interferograms, unconditionally and automatically is still an open…
This work combines the principles of the heat spreader method and imaging capability of the thermoreflectance measurements to measure the in-plane thermal conductivity of thin-films without the requirement of film suspension or multiple…