Related papers: Extending Reflectometry Range, A Zero-Crossing Alg…
We investigate linear resonant absorption by a dense ensemble of molecules confined to a subwavelength layer in two geometries: (i) a free-standing film in homogeneous space and (ii) the same film placed at a controlled distance from a…
Reflection phase imaging provides label-free, high-resolution characterization of biological samples, typically using interferometric-based techniques. Here, we investigate reflection phase microscopy from intensity-only measurements under…
We present a novel, model-independent technique for fitting the cross-component of weak lensing shear, $\gamma_\times$, along a line of sight by combining kinematic and photometric measurements of a single lensed galaxy. Rather than relying…
We have developed a transient thermoreflectance technique using picosecond pulsed and cw laser to study thermal conductivity and interface conductance in both thin-films and bulk materials. A real time-resolved system observes a thermal…
The inability to efficiently tune the optical properties of waveguiding structures has been one of the major hurdles for the future scalability of integrated photonic systems. In silicon photonics, although dynamic tuning has been achieved…
We present the first science results from our Hubble Space Telescope Survey for Lyman limit absorption systems (LLS) using the low dispersion spectroscopic modes of the Advanced Camera for Surveys and the Wide Field Camera 3. Through an…
We demonstrate a motion-free intensity diffraction tomography technique that enables direct inversion of 3D phase and absorption from intensity-only measurements for weakly scattering samples. We derive a novel linear forward model,…
10 H SiC thin films are potential candidates for devices that can be used in high temperature and high radiation environment. Measurement of thermal conductivity of thin films by a non-invasive method is very useful for such device…
We present a robust, precise, and accurate method to simultaneously measure the refractive indices of two transparent materials within an interference coating. This is achieved by measuring both a photometrically accurate transmittance…
The inclusion of material identification in wireless communication system is an emerging area that offers many opportunities for 6G systems. By using reflected radio wave to determine the material of reflecting surface, not only the…
Engineering nanophotonic mode dispersions in ultrathin, planar structures enables significant control over infrared perfect absorption (PA) and thermal emission characteristics. Here, using simulations, the wavelength and angular ranges…
Within the last decade microscopic multiphase flows have gained broad interest. An exact understanding of the underlying hydrodynamic interrelations is the key for successful reactor layout and reaction control. To examine the local…
Diffraction tomography (DT) has been widely explored in transmission-mode configurations, enabling high-resolution, label-free 3D imaging. However, industrial metrology applications, such as semiconductor inspection, typically involve…
We experimentally demonstrate a very large dynamic optical reflection modulation from a simple unpatterned layered stack of phase-change materials ultrathin films. Specifically, we theoretically and experimentally demonstrate that properly…
Optical diffraction tomography (ODT) has emerged as a powerful label-free three-dimensional (3D) bioimaging techniques for observing living cells and thin tissue layers. We report a new reflection-mode ODT (rODT) method for imaging thick…
Imaging objects with high relative permittivity and large electrical size remains a challenging problem in the field of inverse scattering. In this work we present a phaseless inverse scattering method that can accurately image and…
The multiplexing capability of slitless spectroscopy is a powerful asset in creating large spectroscopic datasets, but issues such as spectral confusion make the interpretation of the data challenging. Here we present a new method to search…
Lensless imaging is a popular research field for the advantages of small size, wide field-of-view and low aberration in recent years. However, some traditional lensless imaging methods suffer from slow convergence, mechanical errors and…
A novel broad-band measurement method of the MI in thin films and ribbons is presented. It is based on the automated measurement of the reflection coefficient of a cell loaded with the sample. Illustrative results obtained with a permalloy…
The Multi-Layer Thin Films Problem is a materials science problem that aims to enhance the reflectance of a metallic substrate by designing multi-layer coatings composed of different dielectric materials and thicknesses. While previous…