Nanoroughness induced anti-reflection and haze effects in opaque systems
Abstract
How to make a material anti-reflective without changing its high refraction index? Achieving anti-reflection in high-refractive-index materials poses challenges due to their high reflectivity (Fresnel equations). Based on theory with new boundary conditions, we propose modifying surface properties on a nanoscale to tackle this. Our study on weakly rough opaque surfaces reveals significant changes in specular and diffuse scattering, predicting anti-reflection where roughness matches light penetration depth for the first time. Experimental validation on nano-roughened Si films (at wavelengths 300-400 nm) supports our findings. We also analyze angular and polarization dependences of nanoroughness-induced haze, showing predominant p-polarization and minimal haze at nanoscale, yet impactful specular reflection reduction.
Keywords
Cite
@article{arxiv.2408.05014,
title = {Nanoroughness induced anti-reflection and haze effects in opaque systems},
author = {V. Gareyan and N. Margaryan and Zh. Gevorkian},
journal= {arXiv preprint arXiv:2408.05014},
year = {2024}
}
Comments
11 figures, Supplemental Material