Negative refraction and sub-wavelength imaging using transparent metal-dielectric stacks
Abstract
Negative refraction is known to occur in materials that simultaneously possess a negative electric permittivity and magnetic permeability; hence they are termed negative index materials. However, there are no known natural materials that exhibit a negative index of refraction. In large part, interest in these materials is due to speculation that they could be used as perfect lenses with superresolution. We propose a new way of achieving negative refraction with currently available technology, based on transparent, metallo-dielectric multilayer structures. The advantage of these structures is that both tunability and transmission (well above 50%) can be achieved in the visible wavelength regime. We demonstrate both negative refraction and superresolution in these structures. Our findings point to a simpler way to fabricate a material that exhibits negative refraction. This opens up an entirely new path not only for negative refraction, but also to expand the exploration of wave propagation effects in metals.
Cite
@article{arxiv.physics/0606096,
title = {Negative refraction and sub-wavelength imaging using transparent metal-dielectric stacks},
author = {Michael Scalora and Giuseppe D'Aguanno and Neset Akozbek and Marco Centini and Domenico de Ceglia and Mirko Cappeddu and Nadia Mattiucci and Joseph W. Haus and Mark J. Bloemer},
journal= {arXiv preprint arXiv:physics/0606096},
year = {2015}
}