Related papers: Extending Reflectometry Range, A Zero-Crossing Alg…
Spectroscopic ellipsometry is a powerful method with high surface sensitivity that can be used to monitor the growth of even sub-monolayer film. However, the analysis of ultrathin films is complicated by the correlation of the dielectric…
The detection of spatial or temporal variations in very thin samples has important applications in the biological sciences. For example, cellular membranes exhibit changes in lipid composition and order, which in turn modulate their…
We report on the development of millimeter-wave, lumped-element reflectionless filters using an advanced thin-film fabrication process. Based on previously demonstrated circuit topologies capable of achieving 50{\Omega} impedance match at…
We investigate how feature selection algorithms can enable accurate, reference-free classification of materials using sparse-frequency terahertz (THz) reflection spectroscopy. Three classes of feature selection strategies are evaluated.…
It is shown that reflective laser refractometery at Brewster angle can be usefull for precision measurements of refractive indexes (RI) in the transparency band of various films of nanoscale thickness. The RI measurements of nanoscale…
A coherent, short-length reference arm reflectometer, which utilizes a 76-MHz repetition rate mode-locked fiber laser, was investigated experimentally for long fiber links (> 10 km). The reflectometer combines the advantages of optical…
We propose using THz frequency selective surfaces interrogated with THz subwavelength optical fibers as sensors for monitoring of the optical properties of thick films that are brought in contact with such surfaces. Changes in the test film…
Accurately measuring the geometry and spatially-varying reflectance of real-world objects is a complex task due to their intricate shapes formed by concave features, hollow engravings and diverse surfaces, resulting in inter-reflection and…
This paper presents an efficient algorithm of high-resolution microwave imaging based on the concept of generalized reflectivity. The contribution made in this paper is two-fold. We introduce the concept of non-parametric generalized…
High-rank line-of-sight (LOS) MIMO systems have attracted considerable attention for millimeter wave and THz communications. The small wavelengths in these frequencies enable spatial multiplexing with massive data rates at long distances.…
Accurate measurements of the cross-plane thermal conductivity {\Lambda}_cross of a high-thermal-conductivity thin film on a low-thermal-conductivity ({\Lambda}_s) substrate (e.g., {\Lambda}_cross/{\Lambda}_s>20) are challenging, due to the…
Passive beamforming in reconfigurable intelligent surfaces (RISs) enables a feasible and efficient way of communication when the RIS reflection coefficients are precisely adjusted. In this paper, we present a framework to track the RIS…
Strong nonlinear materials have been sought after for decades for applications in telecommunications, sensing, and quantum optics. Gallium-doped zinc oxide is a II-VI transparent conducting oxide that shows promising nonlinearities similar…
Thin film interferometry is a powerful technique for non-invasively measuring liquid film thickness with applications in ophthalmology, but its clinical translation is hindered by the challenges in reconstructing thickness profiles from…
Large reflection and diffraction losses in the Terahertz (THz) band give rise to degraded coverage abilities in non-line-of-sight (NLoS) areas. To overcome this, a non-intelligent reflecting surface (NIRS) can be used, which is essentially…
For measurements designed to accurately determine layer thickness, there is a natural trade-off between sensitivity to optical thickness and lateral resolution due to the angular ray distribution required for a focused beam. We demonstrate…
A non-invasive, in-situ calibration method for Total Internal Reflection Microscopy (TIRM) based on optical tweezing is presented which greatly expands the capabilities of this technique. We show that by making only simple modifications to…
White light spectral interferometry is applied to measure the refractive index in absorbing liquids in the spectral range from 400 to 1000 nm. We analyze the influence of absorption on the visibility of interferometric fringes and,…
This study presents a comprehensive methodology for determining the thermal conductivity (TC) of materials with high reliability. The methodology addresses issues such as surface topographical variations and substrate interference by…
Reflective imaging systems form an important part of photonic devices such as spectrometers, telescopes, augmented and virtual reality headsets or lithography platforms. Reflective optics provide unparalleled spectral performance and can be…