Related papers: Lateral force microscopy calibration using an inte…
This study presents a novel and user-friendly technique for detecting the lateral capillary force on a floating spherical particle. The technique leverages the interplay between the capillary attracting forces, hydrostatic pressure forces,…
We demonstrate a simple method to significantly improve the sharpness of standard silicon probes for an atomic force microscope, or to repair a damaged probe. The method is based on creating and maintaining a strong, spatially localized…
We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band…
The ability to probe a materials electromechanical functionality on the nanoscale is critical to applications from energy storage and computing to biology and medicine. Voltage modulated atomic force microscopy (VM-AFM) has become a…
Recently, acoustic tweezers based on an array of ultrasonic transducers have been reported taking inspiration from holographic optical tweezers. In the latter technique, the calibration of the optical trap is an essential procedure to…
There is currently no widely adopted standard for the optical characterisation of fluorescence microscopes. We used laser written fluorescence to generate two- and three-dimensional patterns to deliver a quick and quantitative measure of…
A novel method is presented for measuring impulsive forces generated by devices which are fed with medium power microwave signals. The forces are measured with a torsion balance or weighing scale, as usual, but the microwave signal is…
Mechanical properties of biological samples have been imaged with a \textit{Force Feedback Microscope}. Force, force gradient and dissipation are measured simultaneously and quantitatively, merely knowing the AFM cantilever spring constant.…
The paper proposes a novel calibration approach for the Orthoglide-type mechanisms based on observations of the manipulator leg parallelism during motions between the prespecified test postures. It employs a low-cost measuring system…
Numerous cell types relate to their immediate environment by exerting a three-dimensional pressure field on their environment, with components both longitudinal and transverse to the cell membrane. This pressure field can in principle be…
We show that Bloch oscillations of ultracold fermionic atoms in the periodic potential of an optical lattice can be used for a sensitive measurement of forces at the micrometer length scale, e.g. in the vicinity of dielectric surface. In…
We present an interferometric technique for measuring ultra-small tilts. The information of a tilt in one of the mirrors of a modified Sagnac interferometer is carried by the phase difference between the counter propagating laser beams.…
The ongoing development of single electron, nano and atomic scale semiconductor devices would benefit greatly from a characterization tool capable of detecting single electron charging events with high spatial resolution, at low…
Atom-interferometer gyroscopes have attracted much attention for their potential superior long-term stability and extremely low drift. For such high precision instrument, a self-calibration to achieve an absolute rotation measurement is…
Sub-nm resolution images can be achieved by Atomic Force Microscopy (AFM) on samples that are deposited on hard substrates. However, it is still extremely challenging to image soft interfaces, such as biological membranes, due to the…
Amplitude-modulation atomic force microscopy (AM-AFM) measures nanoscale surface structures by detecting changes in the cantilever oscillation amplitude, contributing to materials research. AM-AFM can non-destructively observe fragile…
Dynamic-mode atomic force microscopy (AFM) in liquid remains complicated due to the strong viscous damping of the cantilever resonance. Here we show that a high-quality resonance (Q>20) can be achieved in aqueous solution by attaching a…
Atomic force microscopy (AFM) is one of the most promising methods for investigating the structure of materials at the micro and nanoscale levels, as well as their local physical-mechanical properties. The experimental data obtained with…
We report a systematic study to determine local elastic properties of surfaces combining atomic force microscope (AFM) with acoustic waves which is known as atomic force acoustic microscopy - AFAM. We describe the methodology of AFAM in…
We present an alternative approach to pump-probe spectroscopy for measuring fast charge dynamics with an atomic force microscope (AFM). Our approach is based on coherent multifrequency lock-in measurement of the intermodulation between a…