Related papers: Lateral force microscopy calibration using an inte…
This article describes how a frequency modulation AFM using a hanging fiber force probe made from a quartz tuning fork provides local measurements on liquid-liquid interfaces. After detailing the manufacture and calibration of the force…
Accurately measuring cell stiffness is challenging due to the invasiveness of traditional methods like atomic force microscopy (AFM) and optical stretching. We introduce a non-invasive off-axis system using holographic imaging and acoustic…
An electro-mechanical setup for the measurement of AC-forces in a low-temperature tunnelling microscope has been developed, which enables extremely high force resolution. The crosstalk of vibrations onto the tunnelling current is used to…
The design of an atomic force microscope with an all-fiber interferometric detection scheme capable of atomic resolution at about 500 mK is presented. The microscope body is connected to a small pumped 3He reservoir with a base temperature…
We present a mechanical cantilever-based tabletop interferometer to measure the radiation force exerted by light. Using a high-power (~ 1W) pulsed laser beam, we excite mechanical oscillations in a thin metallic cantilever. The cantilever…
Atomic Force Microscopy with SideWall (AFM SW) is widely used for nano-scale surface measurements at side surfaces. In the current study, by taking into consideration the effects of sidewall beam and its probe, an analytical method is…
Artificial intelligence (AI) and machine learning have promised to revolutionize the way we live and work, and one of particularly promising areas for AI is image analysis. Nevertheless, many current AI applications focus on post-processing…
Precise manipulation of single molecules has already led to remarkable insights in physics, chemistry, biology and medicine. However, widespread adoption of single-molecule techniques has been impeded by equipment cost and the laborious…
The sensitive axes of atom gravimeters are defined by the directions of the respective Raman lasers. Any tilt of the Raman lasers with respect to the vertical direction introduces errors in gravity measurements. In this work, we report a…
We discuss the possibility to enhance the sensitivity of optical interferometric devices by increasing its open area using an external field gradient that act differently on the two arms of the interfer-ometers. The use of combined electric…
The characteristic tip_substrate capacitance is crucial for understanding the localized electrical properties in atomic force microscopy (AFM). Since it is highly dependent on tip geometrical features, estimation of the tip_substrate…
Optical beam deflection is a popular method to measure the deformation of micromechanical devices. As it measures mostly a local slope, its sensitivity depends on the location and size of the optical spot. We present a method to evaluate…
Several types of Wavefront Sensors (WFS) are nowadays available in the field of Adaptive Optics (AO). Generally speaking, their basic principle consists in measuring slopes or curvatures of Wavefront Errors (WFE) transmitted by a telescope,…
Weak measurement amplification, which is considered as a very promising scheme in precision measurement, has been applied to various small physical quantities estimation. Since many quantities can be converted to phase signal, it is thus…
In order to develop a new structure microwave probe, the fabrication of AFM probe on the GaAs wafer was studied. A waveguide was introduced by evaporating Au film on the top and bottom surfaces of the GaAs AFM probe. A tip having 8…
Atomic force microscopy (AFM) with molecule-functionalized tips has emerged as the primary experimental technique for probing the atomic structure of organic molecules on surfaces. Most experiments have been limited to nearly planar…
This paper proposes techniques to calibrate six-axis force-torque sensors that can be performed in situ, i.e., without removing the sensor from the hosting system. We assume that the force-torque sensor is attached to a rigid body equipped…
Atomic Force Microscopy (AFM) operating in the frequency modulation mode with a metal tip functionalized with a CO molecule images the internal structure of molecules with an unprecedented resolution. The interpretation of these images is…
We present an application of a quadrature phase interferometer to the measurement of the angular position of a parallel laser beam with interferometric precision. In our experimental realization we reach a resolution of 6.8e-10 rad (1.4e-4…
A numerical analysis of the origin of the atomic-scale contrast in Kelvin probe force microscopy (KPFM) is presented. Atomistic simulations of the tip-sample interaction force field have been combined with a non-contact Atomic Force…