Related papers: Lateral force microscopy calibration using an inte…
The dynamic behavior of AFM is studied taking into account the nonlinear interaction forces between probe and sample. The exerted forces on the free end of micro-beam are simulated with the third degree polynomial. The effect of some…
A number of aspects of magnetic force microscopy (MFM) specific to the imaging of hard magnetic films have been studied. Firstly, we show that topographic images made in tapping mode with probes characterized by the moderate cantilever…
Atomic force spectroscopy and microscopy (AFM) are invaluable tools to characterize nanostructures and biological systems. Most experiments, including state-of-the-art images of molecular bonds, are achieved by driving probes at their…
We have developed a low temperature, high resolution magnetic force microscope (MFM) using a quartz tuning fork that can operate in a magnetic field. A tuning fork with a spring constant of 1300 N/m mounted with a commercial MFM cantilever…
The lateral Casimir force acting between a sinusoidally corrugated gold plate and sphere was calculated and measured. The experimental setup was based on the atomic force microscope specially adapted for the measurement of the lateral…
We describe here the implementation of an interferometer-based microwave impedance microscope on a home-built tuning-fork based scanning probe microscope (SPM). Tuning-fork based SPMs, requiring only two electrical contacts for…
A single-passage, bimodal magnetic force microscopy technique optimized for scanning samples with arbitrary topography is discussed. A double phase-locked loop (PLL) system is used to mechanically excite a high quality factor cantilever…
A novel scanning probe technique is presented: Scanning microSQUID Force microscopy (SSFM). The instrument features independent topographic and magnetic imaging. The SSFM operates in a dilution refrigerator in cryogenic vacuum. Sample and…
We discuss the application of stress-induced changes in the crystal of a monolithic Nd:YAG laser as a possibility for microforce measurement. In fact, application of an unknown force on the resonator-amplifier-crystal can lead to a several…
We describe the use of optically levitated microspheres as test masses in experiments aimed at reaching and potentially exceeding the standard quantum limit for position measurements. Optically levitated microspheres have low mass and are…
The Casimir-Lifshitz force is calculated between a heterogeneous gapped metal surface and a silica sphere attached to an AFM cantilever tip. We demonstrate that heterogeneous surface patches with different off-stoichiometry surface…
Multiarm interferometers can enhance measurement precision and provide multiparameter capability to the measurement. Their realisation requires multiport beam splitters, which has been a long-standing challenge in free-space and integrated…
Heterodyne receivers register the sky signal on either a circular polarization basis (where it is split into left-hand and right-hand circular polarization) or a linear polarization basis (where it is split into horizontal and vertical…
Traction Force Microscopy (TFM) is a technique used to determine the tensions that a biological cell conveys to the underlying surface. Typically, TFM requires culturing cells on gels with fluorescent beads, followed by bead displacement…
We demonstrate thermally limited force spectroscopy using a probe formed by a dielectric microsphere optically trapped in water near a dielectric surface. We achieve force resolution below 1 fN in 100 s, corresponding to a 2 {\AA} rms…
We derive the lateral Casimir-Polder force on a ground state atom on top of a corrugated surface, up to first order in the corrugation amplitude. Our calculation is based on the scattering approach, which takes into account nonspecular…
Frequency dependent dynamic behavior in Piezoresponse Force Microscopy (PFM) implemented on a beam-deflection atomic force microscope (AFM) is analyzed using a combination of modeling and experimental measurements. The PFM signal comprises…
A novel method for measuring the surface coverage of randomly distributed cylindrical nanoparticles such as nanorods and nanowires, using atomic force microscopy (AFM), is presented. The method offers several advantages over existing…
We have realized a microstrip based THz near field cantilever which enables quantitative measurements of the impedance of the probe tip at THz frequencies (0.3 THz). A key feature is the on-chip balanced hybrid coupler which serves as an…
This article reviews the progress of atomic force microscopy (AFM) in ultra-high vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows to image surfaces of conductors…