Related papers: Scattering near-field optical microscopy at 1-nm r…
Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This…
Scattering scanning near-field optical microscopy (s-SNOM) is a promising technique for overcoming Abbe diffraction limit and substantially enhancing the spatial resolution in spectroscopic imaging. The s-SNOM works by exposing an atomic…
Optical nanoscopy is crucial in life and materials sciences, revealing subtle cellular processes and nanomaterial properties. Scattering-type Scanning Near-field Optical Microscopy (s-SNOM) provides nanoscale resolution, relying on the…
Scattering-type scanning near-field microscopy (s-SNOM) at terahertz (THz) frequencies could become a highly valuable tool for studying a variety of phenomena of both fundamental and applied interest, including mobile carrier excitations or…
Scattering-type scanning near-field optical microscopy (s-SNOM) is a versatile technique in nanooptics, enabling local probing of optical responses beyond the diffraction limit from vis to THz frequencies. Its theoretical modeling based on…
Pseudo-heterodyne scattering-type scanning near-field optical microscopy (sSNOM) is applied in the mid-infrared region to detect the chemical composition of biomolecules on the nanoscale. However, the application of sSNOM in molecular…
Scattering-type scanning near-field optical microscopy (s-SNOM) is instrumental in exploring polaritonic behaviors of two-dimensional (2D) materials at the nanoscale. A sharp s-SNOM tip couples momenta into 2D materials through phase…
Scattering scanning near-field optical microscopy (s-SNOM) is a powerful technique for mid-infrared spectroscopy at nanometer length scales. By investigating objects in aqueous environments through ultrathin membranes, s-SNOM has recently…
The scattering-type Scanning Near-Field Optical Microscope (s-SNOM) is acknowledged as an excellent tool to investigate the optical properties of different materials and biological samples at the nanoscale. In this study we show that s-SNOM…
The ability to perform nanometer-scale optical imaging and spectroscopy is key to deciphering the low-energy effects in quantum materials, as well as vibrational fingerprints in planetary and extraterrestrial particles, catalytic…
We study the response of a conical metallic surface to an external electromagnetic (EM) field by representing the fields in basis functions containing integrable singularities at the tip of the cone. A fast analytical solution is obtained…
We theoretically study resonance responses of flat surfaces and sharp edges of the nanostructures that support excitations of phonon-polaritons in mid-infrared range. We focus on two materials: silicon carbide that has a nearly isotropic…
An atomic force microscope~(AFM) tip, with a few nm-thick noble metal coating, gives rise to strong electric-field at the near-field of tip apex, i.e. hot spot, when illuminated with a beam of light linearly polarized in the axial…
This manuscript demonstrates the theory, design, and simulation of scattering scanning near field microscopy (s-SNOM) in 0.5THz. A comprehensive simulation model of nanotips' geometry, sample materials, and incident field is established to…
We present numerical simulations of scattering-type Scanning Near-Field Optical Microscopy (s-SNOM) of 1D plasmonic graphene junctions. A comprehensive analysis of simulated s-SNOM spectra is performed for three types of junctions. We find…
Scattering-type scanning near-field optical microscopy (s-SNOM) allows for nanoscale resolved Infrared (IR) and Terahertz (THz) imaging, and thus has manifold applications ranging from materials to biosciences. However, a quantitatively…
Recently, the fundamental and nanoscale understanding of complex phenomena in materials research and the life sciences, witnessed considerable progress. However, elucidating the underlying mechanisms, governed by entangled degrees of…
In recent years several methods to overcome diffraction limit in the far field microscopy have been demonstrated. Still the problem of superresolution is reliably solved only for fluorescent microscopy, giving a resolution of up to 20-30nm.…
Near-field optical microscopes with two independent tips for simultaneous excitation and detection can be essential tools for studying localized optical phenomena on the subwavelength scale. Here, we report on the implementation of a fully…
Electric field enhancement mediated through sharp tips in scattering-type scanning near-field optical microscopy (s-SNOM) enables optical material analysis down to the 10-nm length scale, and even below. Nevertheless, mostly the…