Nanotips for 0.5THz scattering scanning near field microscopy
Abstract
This manuscript demonstrates the theory, design, and simulation of scattering scanning near field microscopy (s-SNOM) in 0.5THz. A comprehensive simulation model of nanotips' geometry, sample materials, and incident field is established to significantly improve the scattering efficiency and spatial resolution to achieve optimal performance. The theoretical model is based on full-wave simulation and dipole moment analysis which can describe the overall nanotip's geometry information to screen the optimal parameters corresponding to the 0.5THz, which is the center frequency of most THz sources. The customized nanotip can achieve 40 nm spatial resolution while maintaining an excellent scattering efficiency. This nanotip design method doesn't depend on the homogenization commercial AFM tips, providing an approach for customized nanotip design of THz wave scattering near field microscopy.
Keywords
Cite
@article{arxiv.2307.00742,
title = {Nanotips for 0.5THz scattering scanning near field microscopy},
author = {Zeliang Zhang and Pengfei Qi and Olga Kosavera and Cheng Gong and Lie Lin and Weiwei Liu},
journal= {arXiv preprint arXiv:2307.00742},
year = {2023}
}
Comments
11page, 8figures