Predicting Scattering Scanning Near-field Optical Microscopy of Mass-produced Plasmonic Devices
Abstract
Scattering scanning near-field optical microscopy enables optical imaging and characterization of plasmonic devices with nanometer-scale resolution well below the diffraction limit. This technique enables developers to probe and understand the waveguide-coupled plasmonic antenna in as-fabricated heat-assisted magnetic recording heads. In order validate and predict results and to extract information from experimental measurements that is physically comparable to simulations, a model was developed to translate the simulated electric field into expected near-field measurements using physical parameters specific to scattering scanning near-field optical microscopy physics. The methods used in this paper prove that scattering scanning near-field optical microscopy can be used to determine critical sub-diffraction-limited dimensions of optical field confinement, which is a crucial metrology requirement for the future of nano-optics, semiconductor photonic devices, and biological sensing where the near-field character of light is fundamental to device operation.
Keywords
Cite
@article{arxiv.1802.05259,
title = {Predicting Scattering Scanning Near-field Optical Microscopy of Mass-produced Plasmonic Devices},
author = {Lauren M. Otto and Stanley P. Burgos and Matteo Staffaroni and Shen Ren and Ozgun Suzer and Barry C. Stipe and Paul D. Ashby and Aeron T. Hammack},
journal= {arXiv preprint arXiv:1802.05259},
year = {2018}
}
Comments
article: 18 pages, 5 figures; SI: 15 pages, 12 figures