Evaluation of Analytical Models in Scattering Scanning Near-field Optical Microscopy for High Spatial Resolution Spectroscopy
Optics
2024-11-21 v1
Abstract
Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This paper studies two analytical models for the s-SNOM probe using atomic force microscopy (AFM) tip and its interaction with a dielectric material. We evaluate the validity of these models by retrieving the permittivity spectrum of a sample material through an inverse method.
Keywords
Cite
@article{arxiv.2411.12823,
title = {Evaluation of Analytical Models in Scattering Scanning Near-field Optical Microscopy for High Spatial Resolution Spectroscopy},
author = {Soheil Khajavi and Ali Eghrari and Zahra Shaterzadeh-Yazdi and Mohammad Neshat},
journal= {arXiv preprint arXiv:2411.12823},
year = {2024}
}