We present numerical simulations of scattering-type Scanning Near-Field Optical Microscopy (s-SNOM) of 1D plasmonic graphene junctions. A comprehensive analysis of simulated s-SNOM spectra is performed for three types of junctions. We find conditions when the conventional interpretation of the plasmon reflection coefficients from s-SNOM measurements does not apply. Our results are applicable to other conducting 2D materials and provide a comprehensive understanding of the s-SNOM techniques for probing local transport properties of 2D materials.
@article{arxiv.2108.11086,
title = {Simulation of Scanning Near-Field Optical Microscopy Spectra of 1D Plasmonic Graphene Junctions},
author = {Vyacheslav Semenenko and Mengkun Liu and Vasili Perebeinos},
journal= {arXiv preprint arXiv:2108.11086},
year = {2022}
}