Related papers: Quantitative Formulation of Frequency-Dependent Av…
Atomic force microscopy-based nanoindentation (AFM-NI) enables characterization of the basic mechanical properties of wood pulp fibers in conditions representative of the state inside a paper sheet. Determination of the mechanical…
Electric charge detection by atomic force microscopy (AFM) with single- electron resolution (e-EFM) is a promising way to investigate the electronic level structure of individual quantum dots (QD). The oscillating AFM tip modulates the…
Atomic Force Microscopy (AFM) combined with electrical modes provides a powerful contactless approach to characterize material electrical properties at the nanoscale. However, conventional electrostatic models often overlook dynamic charge…
A force measurement technique has been developed that utilizes a clamped fiber optic element both as a cantilever and as a highly sensitive probe of the static and dynamic displacement of a sample that is mounted near its free end. Light…
Force sensors are at the heart of different technologies such as atomic force microscopy or inertial sensing \cite{RMPforce2003, Rugar2004, YazdiIEEE}. These sensors often rely on the measurement of the displacement amplitude of mechanical…
We report a new experimental technique for Kelvin probe force microscopy (KPFM) using the dissipation signal of frequency modulation atomic force microscopy for bias voltage feedback. It features a simple implementation and faster scanning…
Ultrasound Atomic Force Microscopy (US-AFM) has been used for subsurface imaging of nanostructures. The contact stiffness variations have been suggested as the origin of the image contrast. Therefore, to analyze the image contrast, the…
Direct time-varying tip-sample force measurements by torsional harmonic cantilevers facilitate detailed investigations of the cantilever dynamics in tapping-mode atomic force microscopy. Here we report experimental evidence that the…
We report a Kelvin probe force microscopy (KPFM) implementation using the dissipation signal of a frequency modulation atomic force microscopy that is capable of detecting the gradient of electrostatic force rather than electrostatic force.…
The sensitivity of mechanical resonators to physical quantities such as acceleration, pressure, mass and temperature enables them to underpin sensing and metrology applications. Here, we observe that the resonance frequency of a…
Recent advances in mechanical-diode based ultrasonic force microscopy techniques are reviewed. The potential of Ultrasonic Force Microscopy (UFM) for the study of material elastic properties is explained in detail. Advantages of the…
Atomic force microscopy (AFM) can be used to characterise several aspects of the surface degradation and reinforcement mechanisms of zirconia based ceramics, such as crack propagation, martensitic relief formation, grains pull-out and…
Dynamic atomic force microscopy (AFM) modes that operate at frequencies far away from the resonance frequency of the cantilever (off-resonance tapping (ORT) modes) can provide high-resolution imaging of a wide range of sample types,…
Precision spectroscopy of atoms and molecules allows one to search for and to put stringent limits on the variation of fundamental constants. These experiments are typically interpreted in terms of variations of the fine structure constant…
Atomic force microscopy (AFM) is an essential nanoinstrument technique for several applications such as cell biology and nanoelectronics metrology and inspection. The need for statistically significant sample sizes means that data…
The activated torsion oscillation magnetometer exploits the mechanical resonance of a cantilever beam, driven by the torque exerted on the sample by an ac field applied perpendicularly to the film plane. We describe a model for the…
Ultrasonic AFM may improve fabrication technologies on the nanometer scale. In the presence of ultrasonic vibration, hard surfaces can be indented and scratched with the tip of a soft cantilever, due to its inertia. Ultrasound reduces or…
We discuss the Brownian thermal noise which affects the cantilever dynamics of a dAFM (dynamic atomic force microscope), both when it works in air and in presence of water. Our scope is to accurately describe the cantilever dynamics, and to…
Shape effects in magnetic particles are widely studied, because of the ability of the shape and the size to control the parameters of a sample during its production. Experiments with nano-sized samples show that the shape can affect also…
We study the quantum dynamics of a system consisting of a magnetic molecule placed on a microcantilever. The amplitude and frequencies of the coupled magneto-mechanical oscillations are computed. Parameter-free theory shows that the…