Related papers: Quantitative Formulation of Frequency-Dependent Av…

We present imaging and force spectroscopy measurements of DNA molecules adsorbed on functionalized mica. By means of Non-Contact mode AFM (NC-AFM) in Ultra High Vacuum (UHV), the frequency shift (\Delta f) versus separation (z) curves were…

It was shown recently that the Force Feedback Microscope can avoid the jump-to-contact in Atomic force Microscopy even when the cantilevers used are very soft, thus increasing force resolution. In this letter, we explore theoretical aspects…

We have studied the dynamics of quartz tuning fork resonators used in atomic force microscopy taking into account mechanical energy dissipation through the attachment of the tuning fork base. We find that the tuning fork resonator quality…

While the fundamental limit on the resolution achieved in an atomic force microscope (AFM) is clearly related to the tip radius, the fact that the tip can creep and/or wear during an experiment is often ignored. This is mainly due to the…

Measurements with an atomic force microscope (AFM) offer a direct way to probe elastic properties of lipid bilayer membranes locally: provided the underlying stress-strain relation is known, material parameters such as surface tension or…

We consider theoretically the novel technique in magnetic resonance force microscopy which is called ``oscillating cantilever-driven adiabatic reversals''. We present analytical and numerical analysis for the stationary cantilever…

Recent frequency-modulated atomic force microscopy (FM-AFM) can measure three-dimensional force distribution between a probe and a sample surface in liquid. The force distribution is, in the present circumstances, assumed to be solvation…

Measurements of the deflection induced by thermal noise have been performed on a rectangular atomic force microscope cantilever in air. The detection method, based on polarization interferometry, can achieve a resolution of 1E-14 m/rtHz in…

An observer based adaptive detection methodology (ADM) is proposed for estimating frequency and its rate of change (RoCoF) of the voltage and/or current measurements acquired from an instrument transformer. With guaranteed convergence and…

We present a theoretical study of the measurements of photoinduced force microscopy (PiFM) for composite molecular systems. Using the discrete dipole approximation, we calculate the self-consistent response electric field of the entire…

A method to measure the viscosity of liquids at microscales is presented. It uses a thin glass fiber fixed on the tip of the cantilever of an extremely low noise Atomic Force Microscope (AFM), which accurately measures the cantilever…

Noncontact atomic force microscopy (NC-AFM) and Kelvin probe force microscopy (KPFM) have become important tools for nanotechnology; however, their contrast mechanisms on the atomic scale are not entirely understood. Here we used chlorine…

We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band…

Sensing via a mechanical frequency shift is a powerful measurement tool, and, therefore, understanding and mitigating frequency noise affecting mechanical resonators is imperative. Thermomechanical noise fundamentally limits mechanical…

We assume that the sample height measured using AFM is reduced due to contact deformation. The Herz contact theory is applied for the quantitative description. General numerical solution is found. Analytical approximations for specific…

A novel method for measuring the surface coverage of randomly distributed cylindrical nanoparticles such as nanorods and nanowires, using atomic force microscopy (AFM), is presented. The method offers several advantages over existing…

In this paper, a dynamic model of reconstruction of the shear force $g(t)$ in the Atomic Force Microscopy (AFM) cantilever tip-sample interaction is proposed. The interaction of the cone-shaped cantilever tip with the surface of the…

A new method for examining the possible space-time variation of the fine structure constant ($\alpha$) is proposed. The technique uses a relatively simple measurement with an optical resonator to compare atom-stabilized optical frequency…

We report an Atomic Force Microscopy (AFM) study on thick multi lamellar stacks of approx. 10 mum thickness (about 1500 stacked membranes) of DMPC (1,2-dimyristoyl-sn-glycero-3-phoshatidylcholine) deposited on silicon wafers. These thick…

Atomic Force Microscopy (AFM) operating in the frequency modulation mode with a metal tip functionalized with a CO molecule images the internal structure of molecules with an unprecedented resolution. The interpretation of these images is…