Related papers: X-ray diffraction with micrometer spatial resoluti…
Following the recent demonstration of grazing-incidence X-ray fluorescence (GIXRF) based characterization of the 3D atomic distribution of different elements and dimensional parameters of periodic nanoscale structures, this work presents a…
Nanoprobe X-ray diffraction (nXRD) using focused synchrotron radiation is a powerful technique to study the structural properties of individual semiconductor nanowires. However, when performing the experiment under ambient conditions, the…
We introduce a technique for extracting microstructural geometry from NMR lineshape analysis in porous materials at angstrom-scale resolution with the use of weak magnetic field gradients. Diverging from the generally held view of FID…
A two-dimensional resonant inelastic x-ray scattering (2D-RIXS) microscopy system has been developed at the beamline BL02U of NanoTerasu. The instrument combines a Wolter type-I mirror for spatial imaging with a varied-line-spacing grating…
We present a detailed study of X-ray absorption in the local interstellar medium by analyzing the X-ray spectra of 24 galactic sources obtained with the {\it Chandra} High Energy Transmission Grating Spectrometer and the {\it XMM-Newton}…
The increasing importance of well-controlled ordered nanostructures on surfaces represents a challenge for existing metrology techniques. To develop such nanostructures and monitor complex processing constraints fabrication, both a…
Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailability of wavefront shaping optics, and the highly nonlinear…
Energy dispersive X-ray (EDX) spectrum imaging yields compositional information with a spatial resolution down to the atomic level. However, experimental limitations often produce extremely sparse and noisy EDX spectra. Under such…
The development of the first X-ray polarimeter, based on the photoelectric effect 20 years ago and implemented thanks to advances in gas amplification structures and readout techniques, had a significant impact in opening a new window for…
Dynamical diffraction effects always play a role when working with perfect single crystals. The penetration of X-rays respect to the surface normal during diffraction (extinction depth, $1/\sigma_e$) in perfect single crystals does not have…
A simple optical method is presented for identifying and measuring the effective optical properties of nanometer-thick, graphene-based materials, based on the use of substrates consisting of a thin dielectric layer on silicon. High contrast…
Optically read out gaseous detectors are used in track reconstruction and imaging applications requiring high granularity images. Among resolution-determining factors, the amplification stage plays a crucial role and optimisations of…
Electromagnetic interaction between a sub-wavelength particle (the `probe') and a material surface (the `sample') is studied theoretically. The interaction is shown to be governed by a series of resonances corresponding to surface polariton…
The functionality of materials is determined by their composition and microstructure, that is, the distribution and orientation of crystalline grains, grain boundaries and the defects within them. The characterisation of the material's…
We propose a method to directly visualize the photonic band-structure of micron size photonic crystals using wide angle spectroscopy. By extending Fourier Imaging Spectroscopy sensitivity into the infrared range we have obtained accurate…
The association of scanning transmission electron microscopy (STEM) and the detection of a diffraction pattern at each probe position (so-called 4D-STEM) represents one of the most promising approaches to analyze structural properties of…
High-brilliance synchrotron radiation sources have opened new avenues for X-ray polarization analysis that go far beyond conventional polarimetry in the optical domain. With linear X-ray polarizers in a crossed setting polarization…
We present time-resolved X-ray diffraction measurements using advanced timing schemes that provide high temporal resolution while also maintaining a high flux in the X-ray probe beam. The method employs patterned probe pulse sequences that…
Localized residual stress and elastic strain concentrations in microelectronic devices often affect the electronic performance, resistance to thermomechanical damage, and, likely, radiation tolerance. A primary challenge for…
In this manuscript, we present high spatial resolution focusing of electromagnetic waves at telecommunication wavelengths ({\lambda}0 = 1.55 {\mu}m) by using high-refractive index mesoscale dielectrics placed at the end of an optical fiber.…