A two-dimensional resonant inelastic x-ray scattering (2D-RIXS) microscopy system has been developed at the beamline BL02U of NanoTerasu. The instrument combines a Wolter type-I mirror for spatial imaging with a varied-line-spacing grating spectrometer, simultaneously achieving micrometer-scale spatial resolution and ultrahigh energy resolution in the soft x-ray regime. Test chart measurements confirm a vertical spatial resolution of 1.0 um near the field-of-view center, and the horizontal resolution determined by the incident beam footprint is 0.8 um. RIXS imaging capabilities have been demonstrated by the measurements of a patterned NanoTerasu logo and exfoliated NiPS3 nanoflakes, highlighting its efficiency in locating specific microscale regions within inhomogeneous samples. These results establish 2D-RIXS microscopy as a position-sensitive probe of elementary excitations in quantum materials and functional devices.
@article{arxiv.2511.17966,
title = {2D-RIXS: Resonant inelastic x-ray scattering microscopy with high energy and spatial resolutions},
author = {Kohei Yamamoto and Hakuto Suzuki and Jun Miyawaki},
journal= {arXiv preprint arXiv:2511.17966},
year = {2026}
}