Related papers: Secondary Electron Count Imaging in SEM
Fine structure analysis of core electron excitation spectra is a cornerstone characterization technique across the physical sciences. Spectra are most commonly measured with synchrotron radiation and X-ray spot sizes on the {\mu}m to mm…
Photon-number squeezing and correlations enable measurement of absorption with an accuracy exceeding that of the shot-noise limit. However, sub-shot noise imaging and sensing based on these methods require high detection efficiency, which…
A prototype Secondary-electron Emission Monitor (SEM) was installed in the 8 GeV proton transport line for the MiniBooNE experiment at Fermilab. The SEM is a segmented grid made with 5 um Ti foils, intended for use in the 120 GeV NuMI beam…
Electron microscopy has enabled many scientific breakthroughs across multiple fields. A key challenge is the tuning of microscope parameters based on images to overcome optical aberrations that deteriorate image quality. This calibration…
For its ease manufacturing, flexible geometry, and cheap manufacturing cost, the gas electron multiplier (GEM) detector can be used as an x-ray image sensor. For this purpose, we acquired relative detection efficiencies and suggested a…
We introduce a phase imaging mechanism for scanning transmission electron microscopy that exploits the complementary intensity changes of transmitted disks at different scattering angles. For scanning transmission electron microscopy, this…
Recently it has been shown that precise dose control and an increase in the overall acquisition speed of atomic resolution scanning transmission electron microscope (STEM) images can be achieved by acquiring only a small fraction of the…
The highly energetic electrons in a transmission electron microscope (TEM) can alter or even completely destroy the structure of samples before sufficient information can be obtained. This is especially problematic in the case of zeolites,…
Many modern applications use computer vision to detect and count objects in massive image collections. However, when the detection task is very difficult or in the presence of domain shifts, the counts may be inaccurate even with…
By means of numerical simulations, we demonstrate the innovative use of computational ghost imaging in transmission electron microscopy to retrieve images with a resolution that overcomes the limitations imposed by coherent aberrations. The…
Extremum-seeking control (ESC) is widely used to optimize performance when the system dynamics are uncertain. However, sensitivity to sensor noise is a crucial issue in ESC implementation due to the use of high-pass filters or gradient…
Support estimation (SE) of a sparse signal refers to finding the location indices of the non-zero elements in a sparse representation. Most of the traditional approaches dealing with SE problem are iterative algorithms based on greedy…
For imaging of static object by the means of sequential repeated independent measurements, a theoretical modeling of the behavior of signal-to-noise ratio (SNR) with varying number of measurement is developed, based on the information…
The use of nuclear emulsions in very large physics experiments is now possible thanks to the recent improvements in the industrial production of emulsions and to the development of fast automated microscopes. In this paper the hardware…
In recent decades, developments in detectors for X-ray imaging have improved dose efficiency. This has been accomplished with for example, structured scintillators such as columnar CsI, or with direct detectors where the X rays are…
Microscope mode imaging for secondary ion mass spectrometry is a technique with the promise of simultaneous high spatial resolution and high speed imaging of biomolecules from complex surfaces. Technological developments such as new…
Coherent spin resonance methods such as nuclear magnetic resonance (NMR) and electron spin resonance (ESR) spectroscopy have led to spectrally highly sensitive, non-invasive quantum imaging techniques with groundbreaking applications in…
Scanning tunneling microscopy (STM) and micro-electromechanical systems (MEMS) have traditionally addressed vastly different length scales - one resolving atoms, the other engineering macroscopic motion. Here we unite these two fields to…
The technological advance of High Numerical Aperture Extreme Ultraviolet Lithography (High NA EUVL) has opened the gates to extensive researches on thinner photoresists (below 30nm), necessary for the industrial implementation of High NA…
The Silicon Electron Multiplier (SiEM) is a novel sensor concept for minimum ionizing particle (MIP) detection which uses internal gain and fine pitch to achieve excellent temporal and spatial resolution. In contrast to sensors where the…