Related papers: Secondary Electron Count Imaging in SEM
Driven by life-science applications, mega-electron-volt Scanning Transmission Electron Microscope (MeV-STEM) has been proposed to image thick biological samples. The high penetration of inelastic scattering signals of MeV electrons could…
Semi-supervised learning has attracted much attention due to its less dependence on acquiring abundant annotations from experts compared to fully supervised methods, which is especially important for medical image segmentation which…
This paper presents a novel approach for denoising binary images using simulated annealing (SA), a global optimization technique that addresses the inherent challenges of non convex energy functions. Binary images are often corrupted by…
The progress of semiconductor electronics toward ever-smaller length scales and associated higher power densities brings a need for new high-resolution thermal microscopy techniques. Traditional thermal microscopy is performed by detecting…
Traditional metrics for evaluating the efficacy of image processing techniques do not lend themselves to understanding the capabilities and limitations of modern image processing methods - particularly those enabled by deep learning. When…
Ever increasing hardware capabilities and computation powers have made acquisition and analysis of big scientific data at the nanoscale routine, though much of the data acquired often turns out to be redundant, noisy, and/or irrelevant to…
Processes of the secondary electron emission (SEE) from the walls are included into the Numerical Advanced Model of Electron Cyclotron Resonance Ion Sources (NAM-ECRIS). It is found that SEE strongly influences electron confinement time and…
In this paper we propose a modified cross correlation method to align images from the same class in single-particle electron microscopy of highly non-spherical structures. In this new method, First we coarsely align projection images, and…
The high beam current and sub-angstrom resolution of aberration-corrected scanning transmission electron microscopes has enabled electron energy loss spectroscopic (EELS) mapping with atomic resolution. These spectral maps are often…
We propose a semantic similarity metric for image registration. Existing metrics like Euclidean Distance or Normalized Cross-Correlation focus on aligning intensity values, giving difficulties with low intensity contrast or noise. Our…
Programmable electron-beam scanning offers new opportunities to improve dose efficiency and suppress scan-induced artifacts in scanning transmission electron microscopy. Here, we systematically benchmark the impact of non-raster…
Secondary electron emission (SEE) from inner linings of plasma chambers in electric thrusters for space propulsion can have a disruptive effect on device performance and efficiency. SEE is typically calculated using elastic and inelastic…
Transmission electron microscopy (TEM) is carried out in vacuum to minimize the interaction of the imaging electrons with gas molecules while passing through the microscope column. Nevertheless, in typical devices, the pressure remains at…
This paper proposes a method for estimating and detecting optical signals in practical photon-counting receivers. There are two important aspects of non-perfect photon-counting receivers, namely, (i) dead time which results in blocking…
CEST has proven to be a valuable technique for the detection of hyperpolarized xenon-based functionalized contrast agents. Additional information can be encoded in the spectral dimension, allowing the simultaneous detection of multiple…
When aiming for atomic resolution electron magnetic circular dichroism (EMCD) in STEM mode, the high convergence angle of the electron probe can lead to unforeseen artefacts and strong reductions of the signal to noise ratio (SNR) in the…
Side Channel Analysis (SCA) relaxes the black-box assumption of conventional cryptanalysis by incorporating physical measurements acquired during cryptographic operations. Electro-magnetic (EM) emissions of a chip during computations often…
Aberration-corrected scanning transmission electron microscopes (STEM) provide sub-angstrom lateral resolution; however, the large convergence angle greatly reduces the depth of field. For microscopes with a small depth of field,…
Capturing depth and reflectivity images at low light levels from active illumination of a scene has wide-ranging applications. Conventionally, even with single-photon detectors, hundreds of photon detections are needed at each pixel to…
A novel method of color image enhancement is proposed, in which three or four color channels of the image are transformed to one channel 2-D grayscale image. This paper describes different models of such transformations in the RGB and other…