Related papers: Using Your Beam Efficiently: Reducing Electron-dos…
Lightweight deep learning models offer substantial reductions in computational cost and environmental impact, making them crucial for scientific applications. We present a lightweight CycleGAN for modality transfer in fluorescence…
The simulation of transmission electron microscopy (TEM) images or diffraction patterns is often required to interpret their contrast and extract specimen features. This is especially true for high-resolution phase-contrast imaging of…
The time-resolved electron beam envelope parameters including sectional distribution and position are important and necessary for the study of beam transmission characteristics in the magnetic field and verifying the magnetic field setup…
A transmission electron microscope that takes advantage of superconducting quantum circuitry is proposed. The microscope is designed to improve image contrast of radiation-sensitive weak phase objects, in particular biological specimens.…
Photonic computing has emerged as a promising substrate for accelerating the dense linear-algebra operations at the heart of AI, yet adoption for large Transformer models remains in its infancy. We identify two bottlenecks: (1) costly…
We analytically describe the noise properties of a heralded electron source made from a standard electron gun, a weak photonic coupler, a single photon counter, and an electron energy filter. We argue the traditional heralding figure of…
Accurate simulations of the 21-cm signal from the Epoch of Reionization require the generation of maps at specific frequencies given the values of astrophysical and cosmological parameters. The peculiar velocities of the hydrogen atoms…
Secondary electron (SE) imaging techniques, such as scanning electron microscopy and helium ion microscopy (HIM), use electrons emitted by a sample in response to a focused beam of charged particles incident at a grid of raster scan…
Transient Photoluminescence Microscopy (TPLM) allows for the direct visualization of carrier transport in semiconductor materials with sub nanosecond and few nanometer resolution. The technique is based on measuring changes in the spatial…
We present new data processing techniques that allow to correct the main instrumental effects that degrade the images obtained by ISOCAM, the camera on board the Infrared Space Observatory (ISO). Our techniques take advantage of the fact…
In this paper we propose a low-cost high-speed imaging line scan system. We replace an expensive industrial line scan camera and illumination with a custom-built set-up of cheap off-the-shelf components, yielding a measurement system with…
Image regridding and coaddition have a wide range of applications in astronomical observations. {\sc Imcom}, an algorithm that provides control over point spread function (PSF) and noise in coadded images, has been found to meet the…
Scanning electron microscopy (SEM) is a versatile technique used to image samples at the nanoscale. Conventional imaging by this technique relies on finding the average intensity of the signal generated on a detector by secondary electrons…
This paper discusses the reconstruction of partially sampled spectrum-images to accelerate the acquisition in scanning transmission electron microscopy (STEM). The problem of image reconstruction has been widely considered in the literature…
Numerous everyday situations like navigation, medical imaging and rescue operations require viewing through optically inhomogeneous media. This is a challenging task as photons, instead of traversing ballistically, propagate predominantly…
We describe a scheme for quantum error correction that employs feedback and weak measurement rather than the standard tools of projective measurement and fast controlled unitary gates. The advantage of this scheme over previous protocols…
Increasing peak brightness is beneficial to various applications of Thomson scattering x-ray source. Higher peak brightness of scattered x-ray pulse demands shorter scattering electron beam realized by beam compression in electron…
Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using existing simulation algorithms. We present a new algorithm named PRISM…
When a sample is exposed using electron-beam lithography, the electrons scatter deep and far in the substrate, resulting in unwanted deposition of dose at both the nano- and the microscale. This proximity effect can be mitigated by…
Charge-Coupled Device (CCD) detectors, widely used to obtain digital imaging, can be damaged by high energy radiation. Degraded images appear blurred, because of an effect known as Charge Transfer Inefficiency (CTI), which trails bright…