Related papers: Using Your Beam Efficiently: Reducing Electron-dos…
Light-field microscopy represents a promising solution for microscopic volumetric imaging, thanks to its capability to encode information on multiple planes in a single acquisition. This is achieved through its peculiar simultaneous capture…
Eye tracking is becoming an increasingly important task domain in emerging computing platforms such as Augmented/Virtual Reality (AR/VR). Today's eye tracking system suffers from long end-to-end tracking latency and can easily eat up half…
Scanning Electron Microscopy (SEM) is a widely used tool for nanoparticle characterization, but long-term directional drift can compromise image quality. We present a novel algorithm for post-imaging drift correction in SEM nanoparticle…
The achievable instrumental performance of a scanning transmission electron microscope (STEM) is determined by the size and shape of the incident electron probe. The most important optical factor in achieving the optimum probe profile is…
We report on the commissioning of a fast electron-energy scan system for measurements of electron-impact ionization cross sections. The Giessen crossed-beams experiment employs a high-power electron gun which has been developed over recent…
In future linear colliders the luminosity will depend on maintaining the small emittance aspect ratio delivered by damping rings. Correction of cross-plane coupling can be important in preventing dilution of the beam emittance. In order to…
We model the acceleration of electrons at a shock front in a relativistic blazar jet and compute the radiation they emit in a post-shock region which contains a homogeneous magnetic field. The full space, time and momentum dependence of the…
Focused Ion Beam Scanning Electron Microscope (FIB-SEM) imaging is a technique that image materials section-by-section at nano-resolution, e.g.,5 nanometer width voxels. FIB-SEM is well suited for imaging ultrastructures in cells.…
High energy electron beams can now be routinely focused to 1-2 {\AA} and offer the ability to obtain vibrational information from materials using monochromated electron energy-loss spectroscopy (EELS) in a scanning transmission electron…
Ptychography provides highly efficient imaging in scanning transmission electron microscopy (STEM), but questions have remained over its applicability to strongly scattering samples such as those most commonly seen in materialsscience.…
Although accelerator technology has matured sufficiently, state-of-the-art X-ray linacs for radiotherapy and cargo-scanning capture merely 30-50% of the electrons from a thermionic cathode, requiring a higher cathode current and leaving…
The key to optimizing spatial resolution in a state-of-the-art scanning transmission electron microscope is the ability to precisely measure and correct for electron optical aberrations of the probe-forming lenses. Several diagnostic…
We introduce a denoising method for four-dimensional scanning transmission electron microscopy (4D-STEM) that relies on processing local, scan position-independent electron event-sparse data stacks, called event-sparse stack denoising. This…
Short-scan FDK reconstruction is widely used in preclinical cone-beam micro-CT because it reduces scan time and radiation dose, and because the large volume sizes typical of micro-CT make iterative methods impractical for routine use. Short…
The primary instrument of the proposed EXIST mission is a coded mask high energy telescope (the HET), that must have a wide field of view and extremely good sensitivity. It will be crucial to minimize systematic errors so that even for very…
In near-field beam focusing for finite-sized arrays, focal shift is a non-negligible issue. The actual focal point often appears closer to the array than the predefined focal distance, significantly degrading the focusing performance of…
We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy (STEM) images, aimed at improving structural analysis of materials at the atomic scale. This…
We present a new computation method for simulating reflection high-energy electron diffraction and the total-reflection high-energy positron diffraction experiments. The two experiments are used commonly for the structural analysis of…
Photonic processors have emerged as an attractive platform for fast and energy-efficient matrix-vector multiplication. However, they are susceptible to error due to their analog nature. Here, we present an error-correction technique that…
Characterization and control of the transverse phase space of high-brightness electron beams is required at free-electron lasers or electron diffraction experiments for emittance measurement and beam optimization as well as at advanced…