Related papers: Using Your Beam Efficiently: Reducing Electron-dos…
We present a novel method to measure the arrival time statistics of continuous electron beams with sub-ps resolution, based on the combination of an RF deflection cavity and fast single electron imaging. We observe Poissonian statistics…
In x-ray coherent scatter tomography, tomographic measurements of the forward scatter distribution are used to infer scatter densities within a volume. A radiopaque 2D pattern placed between the object and the detector array enables the…
Fast and high-fidelity qubit measurement is essential for realizing quantum error correction, which is in turn a key ingredient to universal quantum computing. For electron spin qubits, fast readout is one of the significant road blocks…
Three dimensional electron back-scattered diffraction (EBSD) microscopy is a critical tool in many applications in materials science, yet its data quality can fluctuate greatly during the arduous collection process, particularly via…
A common issue encountered in photoemission electron sources used in electron accelerators is the transverse inhomogeneity of the laser distribution resulting from the laser-amplification process and often use of frequency up conversion in…
Single-beam scanning electron microscopes (SEM) are widely used to acquire massive data sets for biomedical study, material analysis, and fabrication inspection. Datasets are typically acquired with uniform acquisition: applying the…
While diffusion-based image restoration (IR) methods have achieved remarkable success, they are still limited by the low inference speed attributed to the necessity of executing hundreds or even thousands of sampling steps. Existing…
Momentum-resolved scanning transmission electron microscopy (MRSTEM) is a powerful phase-contrast technique that can map lateral magnetic and electric fields ranging from the micrometer to the subatomic scale. Resolving fields ranging from…
Aberration corrected scanning transmission electron microscopes (STEM) enable to determine local strain fields, composition and bonding states at atomic resolution. The precision to locate atomic columns is often obstructed by scan…
When a laser passes through underdense plasmas, Raman and Brillouin Backscattering can reflect a substantial portion of the incident laser energy. This is a major loss mechanism, for example, in employing lasers in inertial confinement…
Detecting electronic hot spots is important for understanding the heat dissipation and thermal management of electronic and semiconductor devices. Optical thermoreflective imaging is being used to perform precise temporal and spatial…
Strain has a strong effect on the properties of materials and the performance of electronic devices. Their ever shrinking size translates into a constant demand for accurate and precise measurement methods with very high spatial resolution.…
Electron tomography (ET) has become a standard technique for 3D characterization of materials at the nano-scale. Traditional reconstruction algorithms such as weighted back projection suffer from disruptive artifacts with insufficient…
A fundamental issue that limits the efficiency of many photoelectrochemical systems is that the photon absorption length is typically much longer than the electron diffusion length. Various photon management schemes have been developed to…
We theoretically demonstrate that ponderomotive interactions near the electron cross-over can be used for aberration correction in ultrafast electron microscopes. Highly magnified electron shadow images from Si$_3$N$_4$ thin films are…
Most optical and IR spectra are now acquired using detectors with finite-width pixels in a square array. This paper examines the effects of such pixellation, using computed simulations to illustrate the effects which most concern the…
Power dissipation during test is a major challenge in testing integrated circuits. Dynamic power has been the dominant part of power dissipation in CMOS circuits, however, in future technologies the static portion of power dissipation will…
We use an empirical approach to characterize the effect of charge-transfer efficiency (CTE) losses in images taken with the Wide-Field Channel of the Advanced Camera for Surveys. The study is based on profiles of warm pixels in 168 dark…
We introduce a phase imaging mechanism for scanning transmission electron microscopy that exploits the complementary intensity changes of transmitted disks at different scattering angles. For scanning transmission electron microscopy, this…
This paper aims at designing an on-board beam generation process for multibeam satellite systems with the goal of reducing the traffic at the feeder link. Full frequency reuse among beams is considered and the beamforming at the satellite…