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Four dimensional scanning transmission electron microscopy (4D STEM) records the scattering of electrons in a material in great detail. The benefits offered by 4D STEM are substantial, with the wealth of data it provides facilitating for…

Instrumentation and Detectors · Physics 2021-12-09 Daen Jannis , Christoph Hofer , Chuang Gao , Xiaobin Xie , Armand Béché , Timothy J. Pennycook , Jo Verbeeck

There exist two groups of electron microscopy methods that are capable of providing three-dimensional (3D) structural information of an object, i.e., electron tomography and depth sectioning. Electron tomography is capable of resolving…

Materials Science · Physics 2024-05-28 Liangze Mao , Jizhe Cui , Rong Yu

Strain engineering is used to obtain desirable materials properties in a range of modern technologies. Direct nanoscale measurement of the three-dimensional strain tensor field within these materials has however been limited by a lack of…

Transmission electron diffraction is a powerful and versatile structural probe for the characterization of a broad range of materials, from nanocrystalline thin films to single crystals. With recent developments in fast electron detectors…

Materials Science · Physics 2021-10-06 Jian-Min Zuo , Renliang Yuan , Yu-Tsun Shao , Haw-Wen Hsiao , Saran Pidaparthy , Yang Hu , Qun Yang , Jiong Zhang

Secondary electron (SE) imaging offers a powerful complementary capabilities to conventional scanning transmission electron microscopy (STEM) by providing surface-sensitive, pseudo-3D topographic information. However, contrast…

Applied Physics · Physics 2025-11-19 Evgenii Vlasov , Wouter Heyvaert , Tom Stoops , Sandra Van Aert , Johan Verbeeck , Sara Bals

Electron cryo-tomography (cryo-ET) enables 3D imaging of complex, radiation-sensitive structures with molecular detail. However, image contrast from the interference of scattered electrons is nonlinear with atomic density and multiple…

Three-dimensional atomic resolution imaging using transmission electron microscopes is a unique capability that requires challenging experiments. Linear electron tomography methods are limited by the missing wedge effect, requiring a high…

Computational Physics · Physics 2024-07-30 Shengboy You , Andrey Romanov , Philipp Pelz

The simulation of transmission electron microscopy (TEM) images or diffraction patterns is often required to interpret their contrast and extract specimen features. This is especially true for high-resolution phase-contrast imaging of…

Materials Science · Physics 2021-03-30 Jacob Madsen , Timothy J. Pennycook , Toma Susi

To study the fundamental physics of complex multiphase flow systems using advanced measurement techniques, especially the electrical capacitance tomography (ECT) approach, this article carries out an initial literature review of the ECT…

Computer Vision and Pattern Recognition · Computer Science 2015-10-16 Kezhi Li

Three-dimensional (3D) imaging of thin, extended specimens at nanometer resolution is critical for applications in biology, materials science, advanced synthesis, and manufacturing. One route to 3D imaging is tomography, which requires a…

Instrumentation and Detectors · Physics 2023-10-23 Deepan Balakrishnan , See Wee Chee , Zhaslan Baraissov , Michel Bosman , Utkur Mirsaidov , N. Duane Loh

Atomic-resolution scanning transmission electron microscopy (STEM) characterization requires precise tilting of the specimen to high symmetric zone axis, which is usually processed in reciprocal space by following the diffraction patterns.…

Materials Science · Physics 2024-06-04 Jiake Wei , Zhangze Xu , Wenjie Shen , Bin Feng , Ryo Ishikawa , Naoya Shibata , Yuichi Ikuhara , Xuedong Bai

When characterising beam-sensitive materials in the scanning transmission electron microscope (STEM), low-dose techniques are essential for the reliable observation of samples in their true state. A simple route to minimise both the total…

Instrumentation and Detectors · Physics 2021-02-24 Tiarnan Mullarkey , Clive Downing , Lewys Jones

Resolving single atoms in large-scale volumes has been a goal for atomic resolution microscopy for a long time. Electron microscopy has come close to this goal using a combination of advanced electron optics and computational imaging…

Materials Science · Physics 2023-11-07 Andrey Romanov , Min Gee Cho , Mary Cooper Scott , Colin Ophus , Philipp Pelz

Momentum-resolved scanning transmission electron microscopy (MRSTEM) is a powerful phase-contrast technique that can map lateral magnetic and electric fields ranging from the micrometer to the subatomic scale. Resolving fields ranging from…

Three-dimensional electron diffraction (3DED) is a powerful technique providing for crystal structure solutions of sub-micron sized crystals too small for structure determination via X-ray techniques. The entry requirement, however, of a…

We report on the development of Electron Holographic Tomography towards a versatile potential measurement technique, overcoming several limitations, such as a limited tilt range, previously hampering a reproducible and accurate…

Materials Science · Physics 2015-06-22 A. Lubk , D. Wolf , P. Prete , N. Lovergine , T. Niermann , S. Sturm , H. Lichte

Determining the 3D structures of biological molecules is a key problem for both biology and medicine. Electron Cryomicroscopy (Cryo-EM) is a promising technique for structure estimation which relies heavily on computational methods to…

Machine Learning · Statistics 2015-01-29 Ali Punjani , Marcus A. Brubaker

Purpose: Electron density is the most important tissue property influencing photon and ion dose distributions in radiotherapy patients. Dual-energy computed tomography (DECT) enables the determination of electron density by combining the…

Medical Physics · Physics 2017-06-29 Christian Möhler , Patrick Wohlfahrt , Christian Richter , Steffen Greilich

Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe forming lens. Now atomic-sized beams are routine, even at accelerating voltages as…

The Electrical Resistance Tomography (ERT) technique is applied to the measurement of sheet conductance maps of both uniform and patterned conductive thin films. Images of the sheet conductance spatial distribution, and local conductivity…

Instrumentation and Detectors · Physics 2016-06-21 Alessandro Cultrera , Luca Callegaro