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Near-Isotropic Sub-{\AA}ngstrom 3D Resolution Phase Contrast Imaging Achieved by End-to-End Ptychographic Electron Tomography

Computational Physics 2024-07-30 v1 Materials Science Machine Learning Optimization and Control

Abstract

Three-dimensional atomic resolution imaging using transmission electron microscopes is a unique capability that requires challenging experiments. Linear electron tomography methods are limited by the missing wedge effect, requiring a high tilt range. Multislice ptychography can achieve deep sub-{\AA}ngstrom resolution in the transverse direction, but the depth resolution is limited to 2 to 3 nanometers. In this paper, we propose and demonstrate an end-to-end approach to reconstructing the electrostatic potential volume of the sample directly from the 4D-STEM datasets. End-to-end multi-slice ptychographic tomography recovers several slices at each tomography tilt angle and compensates for the missing wedge effect. The algorithm is initially tested in simulation with a Pt@Al2O3\mathrm{Al_2O_3} core-shell nanoparticle, where both heavy and light atoms are recovered in 3D from an unaligned 4D-STEM tilt series with a restricted tilt range of 90 degrees. We also demonstrate the algorithm experimentally, recovering a Te nanoparticle with sub-{\AA}ngstrom resolution.

Keywords

Cite

@article{arxiv.2407.19407,
  title  = {Near-Isotropic Sub-{\AA}ngstrom 3D Resolution Phase Contrast Imaging Achieved by End-to-End Ptychographic Electron Tomography},
  author = {Shengboy You and Andrey Romanov and Philipp Pelz},
  journal= {arXiv preprint arXiv:2407.19407},
  year   = {2024}
}