Three-dimensional (3D) imaging of thin, extended specimens at nanometer resolution is critical for applications in biology, materials science, advanced synthesis, and manufacturing. One route to 3D imaging is tomography, which requires a tilt series of a local region. Here we describe a coherent imaging alternative that recovers the 3D volume of a thin, homogeneously amorphous specimen with only a single, energy-filtered, bright-field image. We demonstrated this technique with a transmission electron microscope to fill a glaring gap for rapid, accessible, non-destructive 3D nanometrology. This technique is applicable, in general, to any coherent bright field imaging with electrons, photons, or any other wavelike particles.
@article{arxiv.2209.07930,
title = {Single-shot, coherent, pop-out 3D metrology},
author = {Deepan Balakrishnan and See Wee Chee and Zhaslan Baraissov and Michel Bosman and Utkur Mirsaidov and N. Duane Loh},
journal= {arXiv preprint arXiv:2209.07930},
year = {2023}
}