Related papers: Probes for Ultrasensitive THz Nanoscopy
A recent advance in improving the spatial resolution of magnetic force microscopy (MFM) uses as sensor tips carbon nanotubes grown at the apex of conventional silicon cantilever pyramids and coated with a thin ferromagnetic layer. Magnetic…
The tip artifact in atomic force microscopy (AFM) observations of InAs islands was evaluated quantitatively. The islands were grown in the Stranski-Krastanow mode of molecular beam epitaxy. The width and height of the islands were…
Squeezed light offers genuine quantum advantage in enhanced sensing and quantum computation; yet the level of squeezing or quantum noise reduction generated from nanophotonic chips has been limited. In addition to strong quantum noise…
We demonstrate a dynamic scanning capacitance microscope (DSCM) that operates at large bandwidths, cryogenic temperatures and high magnetic fields. The setup is based on a non-contact atomic force microscope (AFM) with a quartz tuning fork…
The platinum/iridium (Pt/Ir) alloy tip for scanning probe microscopy (SPM) was fabricated by amplitude-modulated alternating-current (AC) electropolishing. The clean tips with a radius of curvature less than 100 nm were reproducibly…
The slow advance of a crack in sodo-silicate glasses was studied at nanometer scale by in situ and real time atomic force microscopy (AFM) in a well controlled atmosphere. An enhanced diffusion of sodium ions in the stress gradient field at…
In scanning gate microscopy, where the tip of a scanning force microscope is used as a movable gate to study electronic transport in nanostructures, the shape and magnitude of the tip-induced potential are important for the resolution and…
We present an alternative switching-magnetization magnetic force microscopy (SM- MFM) method using planar tip-on-chip probes. Unlike traditional needle-like tips, the planar probe approach integrates a microdevice near the tip apex with…
On-chip technology based on acoustic waves is a strong asset in modern telecommunication with the prospects of becoming a cornerstone of next-generation devices. In this context, mapping and manipulating acoustic waves through coherent…
Nanoscale optoelectronic components achieve functionality via spatial variation in electronic structure induced by composition, defects, and dopants. To dynamically change the local band alignment and influence defect states, a scanning…
The functional properties of many technological surfaces in biotechnology, electronics, and mechanical engineering depend to a large degree on the individual features of their nanoscale surface texture, which in turn are a function of the…
Imaging applications in the terahertz (THz) frequency range are severely restricted by diffraction. Near-field scanning probe microscopy is commonly employed to enable mapping of the THz electromagnetic fields with sub-wavelength spatial…
Understanding the nanoscale carrier dynamics induced by light excitation is the key to unlocking futuristic devices and innovative functionalities in advanced materials. Optical pump-probe scanning tunneling microscopy (OPP-STM) has opened…
Scanning tunneling microscope (STM) is a powerful tool for studying the structural and electronic properties of materials at the atomic scale. The combination of low temperature and high magnetic field for STM and related spectroscopy…
We introduce a novel control mode for Scanning Tunneling Microscopy (STM) that leverages di/dz feedback. By superimposing a high-frequency sinusoidal modulation on the control signal, we extract the amplitude of the resulting tunneling…
We report on the fabrication and performance of a new kind of tip for scanning tunneling microscopy. By fully incorporating a metallic tip on a silicon chip using modern micromachining and nanofabrication techniques, we realize so-called…
We present a new approach to tuning fork-based atomic force microscopy for utilizing advanced "tip-on-chip" probes with high sensitivity and broad compatibility. Usually, such chip-like probes with a size reaching 2 mm x 2 mm drastically…
Quartz tuning fork-based atomic force microscopy (QTF-AFM) has become a powerful tool for high-resolution imaging of both conductive and insulating samples, including semiconductor structures and metal-coated surfaces as well as soft matter…
A Scanning Tunneling Microscope (STM) is one of the most important scanning probe tools available to study and manipulate matter at the nanoscale. In a STM, a tip is scanned on top of a surface with a separation of a few \AA. Often, the…
We present a detailed investigation of the near-field optical response of core-shell nanoparticles using Fourier-demodulated full-wave simulations, revealing significant modifications to established contrast mechanisms in scattering-type…