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The characteristic tip_substrate capacitance is crucial for understanding the localized electrical properties in atomic force microscopy (AFM). Since it is highly dependent on tip geometrical features, estimation of the tip_substrate…

Mesoscale and Nanoscale Physics · Physics 2016-01-25 Reynier I. Revilla

The torsional vibration of atomic force microscope (AFM) cantilevers is critical for high-sensitivity measurements, yet existing models for width-varying cantilevers often rely on approximations that lead to significant discrepancies with…

Applied Physics · Physics 2025-11-25 Le Tri Dat , Nguyen Duy Vy

Coupling phase-stable single-cycle terahertz (THz) pulses to scanning tunneling microscope (STM) junctions enables spatio-temporal imaging with femtosecond temporal and \r{A}ngstrom spatial resolution. The time resolution achieved in such…

Applied Physics · Physics 2020-08-28 Melanie Müller , Natalia Martín Sabanés , Tobias Kampfrath , Martin Wolf

Terahertz (THz) spectroscopy holds transformative potential for non-invasive sensing, yet characterizing individual nanoparticles in complex biological environments remains challenging due to the far-field diffraction limit. While…

Applied Physics · Physics 2026-02-06 Ricardo Martin Abraham-Ekeroth , Dani Torrent

The force sensor is key to the performance of atomic force microscopy (AFM). Nowadays, most AFMs use micro-machined force sensors made from silicon, but piezoelectric quartz sensors are applied at an increasing rate, mainly in vacuum. These…

Mesoscale and Nanoscale Physics · Physics 2015-03-19 Franz J. Giessibl , Florian Pielmeier , Toyoaki Eguchi , Toshu An , Yukio Hasegawa

Molecular and atomic imaging required the development of electron and scanning probe microscopies to surpass the physical limits dictated by diffraction. Nano-infrared experiments and pico-cavity tip-enhanced Raman spectroscopy imaging…

Single atom/molecule manipulation with a scanning-tunneling-microscope (STM) tip is an innovative experimental technique of nanoscience. Using STM-tip as an engineering or analytical tool, artificial atomic-scale structures can be…

Materials Science · Physics 2015-06-25 Saw-Wai Hla

An atomic force microscope (AFM) is capable of producing ultra-high resolution measurements of nanoscopic objects and forces. It is an indispensable tool for various scientific disciplines such as molecular engineering, solid-state physics,…

Applications · Statistics 2017-06-28 Bryan Yates , Aleksander Labuda , Martin Lysy

Terahertz (THz) near-field imaging is a flourishing discipline [1], with applications from fundamental studies of beam propagation [2,3] to the characterisation of metameterials [4,5] and waveguides [6,7]. Beating the diffraction limit…

alpha-Sn has recently been attracting significant interest due to its unique electronic properties. However, this allotrope of Sn is stable only below 13 {\deg}C and alternative options to the conventional stabilization by epitaxial growth…

Here we report nonlinear focal modulation microscopy (NFOMM) to achieve super-resolution imaging. Abandoning the previous persistence on minimizing the size of Gaussian emission pattern by directly narrowing (e.g. Minimizing the detection…

Chip-based terahertz (THz) devices are emerging as versatile tools for manipulating mm-wave frequencies in the context of integrated high-speed communication technologies for potential sixth-generation (6G) wireless applications. The…

Scanning transmission X-ray microscopy (STXM) is a nanoscale imaging technique that can utilize several powerful contrast mechanisms for the quantitative mapping of chemical and physical materials properties. Spatial resolutions down to…

Instrumentation and Detectors · Physics 2026-05-27 Simone Finizio , Benjamin Watts , Benedikt Rösner , Tim A. Butcher , Sebastian Wintz , Markus Weigand , Jörg Raabe

We realize a scanning probe microscope using single trapped $^{87}$Rb atoms to measure optical fields with subwavelength spatial resolution. Our microscope operates by detecting fluorescence from a single atom driven by near-resonant light…

Atomic Physics · Physics 2022-03-02 Emma Deist , Justin A. Gerber , Yue-Hui Lu , Johannes Zeiher , Dan M. Stamper-Kurn

A theoretical study describing the coherence properties of near-field Raman scattering in two- and one-dimensional systems is presented. The model is applied to the Raman modes of pristine graphene and graphene edges. Our analysis is based…

Mesoscale and Nanoscale Physics · Physics 2014-03-31 Luiz Gustavo Cançado , Ryan Beams , Ado Jorio , Lukas Novotny

We use fluorescent nanospheres as scalar detectors for the electric-field intensity in order to probe the near-field of an optical tip used in aperture-type near-field scanning optical microscopy (NSOM). Surprisingly, the recorded…

Optics · Physics 2007-05-23 A. Drezet , M. J. Nasse , S. Huant , J. C. Woehl

A scanning tunneling microscope (STM) with a magnetic tip that has a sufficiently strong spin-polarization can be used to map the sample's spin structure down to the atomic scale but usually lacks the possibility to absolutely determine the…

Superconductivity · Physics 2021-04-26 Lucas Schneider , Philip Beck , Jens Wiebe , Roland Wiesendanger

The optoelectronic properties of nanoscale systems such as carbon nanotubes (CNTs), graphene nanoribbons and transition metal dichalcogenides (TMDCs) are determined by their dielectric function. This complex, frequency dependent function is…

Materials Science · Physics 2021-11-10 Oisín Garrity , Alvaro Rodriguez , Niclas S. Mueller , Otakar Frank , Patryk Kusch

Near-field infrared spectroscopy by elastic scattering of light from a probe tip resolves optical contrasts in materials at dramatically sub-wavelength scales across a broad energy range, with the demonstrated capacity for chemical…

We report on the design and performance of a cryogenic (300 mK) near-field scanning microwave microscope. It uses a microwave resonator as the near-field sensor, operating at a frequency of 6 GHz and microwave probing amplitudes down to 100…

Mesoscale and Nanoscale Physics · Physics 2014-04-03 S. E. de Graaf , A. V. Danilov , A. Adamyan , S. E. Kubatkin