Related papers: Soft x-ray absorption of thin films detected using…
Encapsulation layers are explored for passivating the surfaces of silicon to reduce optical absorption in the 1500-nm wavelength band. Surface-sensitive test structures consisting of microdisk resonators are fabricated for this purpose.…
Thin film oxides are a source of endless fascination for the materials scientist. These materials are highly flexible, can be integrated into almost limitless combinations, and exhibit many useful functionalities for device applications.…
While most tactile sensors rely on measuring pressure, insights from continuum mechanics suggest that measuring shear strain provides critical information for tactile sensing. In this work, we introduce an optical tactile sensing principle…
We develop a means for speckle-based phase imaging of the projected thickness of a single-material object, under the assumption of illumination by spatially random time-independent x-ray speckles. These speckles are generated by passing x…
X-ray photoelectron spectroscopy (XPS) is a widely used technique for chemical analysis of solid surfaces, sensitive to the chemical environments of atoms via core-level binding energy shifts. While modern instruments allow experimental…
In semiconductor manufacturing processes, silicon dioxide films are commonly used as barrier layers, insulating layers, and protective layers. Coherence scanning interferometry (CSI) offers thin film thickness measurements with a…
A simple optical method is presented for identifying and measuring the effective optical properties of nanometer-thick, graphene-based materials, based on the use of substrates consisting of a thin dielectric layer on silicon. High contrast…
Liquid xenon (LXe) is a very attractive material as a detection medium for ionization detectors due to its high density, high atomic number, and low energy required to produce electron-ion pairs. Therefore it has been used in several…
We model the absorption of X-rays by gas obscuring the source and photoionized by it. We consider a broad range of column densities, including both Thomson-thin and Thomson-thick media. For the Thomson thin regime, we derive a simple…
The ultrathin X-ray entrance window for the spaceborne spectrometer SIXA was characterised using synchrotron radiation. X-ray absorption fine structure near the absorption edges of the constituting elements (aluminium, carbon, oxygen and…
We demonstrate the feasibility of obtaining accurate pair distribution functions of thin amorphous films down to 80 nm, using modern laboratory-based x-ray sources. The pair distribution functions are obtained using a single diffraction…
Imaging of nanoscale magnetic textures within extended material systems is of critical importance both to fundamental research and technological applications. Whilst high resolution magnetic imaging of thin nanoscale samples is…
In recent years a new field emerged in dark matter community and immediately attracted a multitude of theoriests and experimentalists, that of light dark matter direct detection in electronic systems. The phenomenon is similar with nuclear…
A gas cell for in-situ measurements of Volatile Organic Compounds (VOCs) and their adsorption behavior on different surfaces by means of X-Ray Fluorescence (XRF) and X-ray Absorption Fine-Structure (XAFS) spectroscopy has been developed.…
Resonant inelastic X-ray scattering (RIXS) has become an important scientific tool. Nonetheless, conventional high-resolution RIXS measurements (<100 meV), especially in the soft x-ray range, require large and low-throughput grating…
This paper presents the results of the characterisation of a back-illuminated pixel sensor manufactured in Silicon-On-Insulator technology on a high-resistivity substrate with soft X-rays. The sensor is thinned and a thin Phosphor layer…
Structure determination is a key application of XFELs and 4th generation synchrotron sources, particularly using the coherent and pulsed X-ray radiation from X-ray free-electron lasers (XFEL). Scientific interest focuses on understanding…
The lateral resolution of an X-ray photoelectron spectroscopy instrument, which is equipped with a focused X-ray beam, is limited by the nominal X-ray beam diameter and the long tail intensity distri-bution of the X-ray beam. The long tail…
Synchrotron-based x-ray reflectivity is increasingly employed as an \textit{in situ} probe of surface morphology during thin film growth, but complete interpretation of the results requires modeling the growth process. Many models have been…
X-ray dark-field imaging creates a representation of the sample where contrast is generated by subresolution features within the volume under inspection. These are detected by a local measurement of the radiation field's angular…