Using photoelectron spectroscopy to measure resonant inelastic X-ray scattering: A computational investigation
Abstract
Resonant inelastic X-ray scattering (RIXS) has become an important scientific tool. Nonetheless, conventional high-resolution RIXS measurements (<100 meV), especially in the soft x-ray range, require large and low-throughput grating spectrometers that limits measurement accuracy and simplicity. Here, we computationally investigate the performance of a different method for measuring RIXS, Photoelectron Spectrometry for Analysis of X-rays (PAX). This method transforms the X-ray measurement problem of RIXS to an electron measurement problem, enabling use of compact, high-throughput electron spectrometers. In PAX, X-rays to be measured are incident on a converter material and the energy distribution of the resultant photoelectrons, the PAX spectrum, is measured with an electron spectrometer. The incident X-ray spectrum is then estimated through a deconvolution algorithm that leverages concepts from machine learning. We investigate a few example PAX cases. Using the 3d levels of Ag as a converter material, and with 10 detected electrons, we accurately estimate features with 100s of meV width in a model RIXS spectrum. Using a sharp Fermi edge to encode RIXS spectra, we accurately distinguish 100 meV FWHM peaks separated by 45 meV with 10 electrons detected that were photoemitted from within 0.4 eV of the Fermi level.
Keywords
Cite
@article{arxiv.2006.10914,
title = {Using photoelectron spectroscopy to measure resonant inelastic X-ray scattering: A computational investigation},
author = {Daniel J. Higley and Hirohito Ogasawara and Sioan Zohar and Georgi L. Dakovski},
journal= {arXiv preprint arXiv:2006.10914},
year = {2020}
}