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The angular resolution measure (ARM) is widely used in Compton camera analyses to characterize angular uncertainty and to define event selection criteria. However, the ARM distribution is fundamentally different from the point spread…
The radiation hardness of the AToM chips of the BaBar Silicon Vertex Tracker has been investigated by means of irradiations with photons from a 60Co source and 0.9 GeV electrons. The increase in noise and the decrease in gain of the…
Research in semiconductor physics has advanced to the study of two-dimensional (2D) materials where the surface controls electronic transport. A scanning probe microscope (SPM) is an ideal tool to image electronic motion in these devices by…
The profile of suspended silicon nitride thin films patterned with one-dimensional subwavelength grating structures is investigated using Atomic Force Microscopy. We first show that the results of the profilometry can be used as input to…
Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sample interactions. Local measurement of chemical properties…
Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable…
Silicon immersion gratings and grisms enable compact, near-infrared spectrographs with high throughput. These instruments find use in ground-based efforts to characterize stellar and exoplanet atmospheres, and in space-based observatories.…
Sensors and actuators based on resonant micro-electro-mechanical systems (MEMS), such as scanning micro mirrors, are well-established in automotive and consumer products. As the areas of application broaden, the requirements for the MEMS…
The M\"ONCH hybrid pixel detector, with a 25 \textmu m pixel pitch and fast charge-integrating readout, has demonstrated subpixel resolution capabilities for X-ray imaging and deep learning-based electron localization in electron…
Wavefront distortions are a leading source of systematic uncertainty in light-pulse atom interferometry, limiting absolute measurements of gravitational acceleration at the 30 nm/s$^2$ level. Here, we demonstrate in situ spatially resolved…
The roughness of fracture surfaces has been shown to exhibit self-affne scale invariance for a wide variety of materials and loading conditions. The range of scales over which this regime extends remains a matter of debate, together with…
The GRIT (Granularity, Resolution, Identification, Transparency) Silicon array is intended to measure direct reactions. Its design is based on several layers (three layers in the forward direction, two backward) of custom-made trapezoidal…
The Near-Field Microwave Microscope (NSMM) can be used to measure ohmic losses of metallic thin films. We report on the presence of a new length scale in the probe-to- sample interaction for the NSMM. We observe that this length scale plays…
A gallium arsenide detector was tested with a beam of 70GeV pions at the {\sf SPS} at CERN. The detector utilises a novel biasing scheme which has been shown to behave as expected. The detector has a pitch of 50$\mu$m and therefore an…
Scanning tunneling luminescence microscopy (STLM) along with scanning tunneling spectroscopy (STS) is applied to a step-bunched, oxidized 4H-SiC surface prepared on the silicon face of a commercial, n-type SiC wafer using a silicon melt…
Surface temperature measurements were performed with a Scanning Thermal Microscope mounted with a thermoresistive wire probe of micrometrSurface temperature measurements were performed with a Scanning Thermal Microscope mounted with a…
Our interest has been to study the effect that scattered radiation has on contrast, signal-to-noise ratio and thickness reconstruction in digital mammographies. Using the GEANT code we have performed Monte-Carlo simulations of 25 kVp Mo/Mo…
A new method is introduced for calibrating lateral force as measured by an atomic force microscope (AFM), making use of both an interferometric detector and an optical beam detector on the same instrument. The method may be implemented…
Gradient index (GRIN) fibers are used to improve the design of many fiber optic devices. However, the properties of the GRIN fiber must be determined to optimally engineer a device which incorporates GRIN fiber components. The index of…
Weak gravitational lensing has the potential to constrain cosmological parameters to high precision. However, as shown by the Shear TEsting Programmes (STEP) and GRavitational lEnsing Accuracy Testing (GREAT) Challenges, measuring galaxy…