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GaAs Microstrip Testbeam Results

High Energy Physics - Experiment 2007-05-23 v1

Abstract

A gallium arsenide detector was tested with a beam of 70GeV pions at the {\sf SPS} at CERN. The detector utilises a novel biasing scheme which has been shown to behave as expected. The detector has a pitch of 50μ\mum and therefore an expected resolution of 14.5μ\mum. The measured resolution was approximately 14μ\mum. By using a non-linear charge division algorithm this can be increased to \approx 12μ\mum. Noise was the limiting factor to the resolution. This was 2000e^- as opposed to the expected 360e^-. This noise is also thought to have reduced the detection efficiency of the detector. The source of the excess noise is currently being investigated.

Keywords

Cite

@article{arxiv.hep-ex/9509008,
  title  = {GaAs Microstrip Testbeam Results},
  author = {S. Gowdy},
  journal= {arXiv preprint arXiv:hep-ex/9509008},
  year   = {2007}
}

Comments

10 pages. 16 postscript figures + 1 postscript preprint logo + 1 LaTeX file + 2 non-standard style files. Uses epsfig. Files tarred, gzipped and uuencoded into 1 file. Also available at http://ppewww.ph.gla.ac.uk/preprints/95/04