Related papers: A Planar Scanning Probe Microscope
Indium arsenide nanowires grown by selective-area vapor phase epitaxy are used as tips for scanning tunneling microscopy (STM). The STM tips are realized by positioning the wires manually on the corner of a double cleaved gallium arsenide…
The contemporary superconductive electronics is widely using planar circuits with micrometer-scale elements for a variety of applications. With the rise of complexity of a circuit and increased number of its components, a simple impedance…
Although several optical techniques have been recently developed in order to overcome the resolution limit in microscopy, the imaging of sub-wavelength features is still a real challenge. In practise, super-resolution techniques remain…
Progress in spintronics has been aided by characterization tools tailored to certain archetypical materials. New device structures and materials will require characterization tools that are material independent, provide sufficient…
We introduce a point-like scanning single-photon source that operates at room temperature and offers an exceptional photostability (no blinking, no bleaching). This is obtained by grafting in a controlled way a diamond nanocrystal (size…
Atomic scale characterization and manipulation with scanning probe microscopy rely upon the use of an atomically sharp probe. Here we present automated methods based on machine learning to automatically detect and recondition the quality of…
Recent advances in scanning probe techniques rely on the chemical functionalization of the probe-tip termination by a single molecule. The success of this approach opens the tantalizing prospect of introducing spin sensitivity through the…
Magneto-plasmonic nanostructures have emerged as promising candidates for advanced sensing applications. However, conventional fabrication methods, such as lithography and sputtering, often involve high costs and complex processes. This…
The performance of tip-enhanced optical microscopy is often limited by inefficient coupling of the excitation field to the plasmonic tip apex, as well as by thermal drift and optical aberrations. Here, we demonstrate that adaptive wavefront…
Single-mode optical nanofibres are a central component of a broad range of applications and emerging technologies. Their fabrication has been extensively studied over the past decade, but imaging of the final sub-micrometre products has…
The Near-Field Scanning Microwave Microscope (NSMM) can quantitatively image materials properties at length scales far shorter than the free space wavelength (\lambda). Here we report a study of the effect of tip-geometry on the NSMM…
We use fluorescent nanospheres as scalar detectors for the electric-field intensity in order to probe the near-field of an optical tip used in aperture-type near-field scanning optical microscopy (NSOM). Surprisingly, the recorded…
A nanoscopy technique that can characterize light-matter interactions with ever increasing spatial resolution and signal-to-noise ratio (SNR) is desired for spectroscopy at molecular levels. Photoinduced force microscopy (PiFM) with…
We analyse how a probing particle modifies infrared electromagnetic near fields. The particle, assimilated to both electric and magnetic dipoles, represents the tip of an apertureless scanning optical near-field microscope (SNOM). We show…
This article reviews the new developments in Tip-enhanced Raman scattering (TERS). The fundamental mechanisms underlying the Raman enhancement are discussed, including the role of the plasmonic character of the metallic tips, the nature of…
Mitigating the far sidelobes of a wide field-of-view telescope is one of the critical issues for polarization observation of the cosmic microwave background. Since even small reflections of stray light at the millimeter-wave absorbers…
We introduce a statistical correlation analysis method to obtain information on the local geometry and orientation of the tip used in scanning tunneling microscopy (STM) experiments based on large scale simulations. The key quantity is the…
Pump-probe microscopy is an emerging nonlinear imaging technique based on high repetition rate lasers and fast intensity modulation. Here we present new methods for pump-probe microscopy that keep the beam intensity constant and instead…
In applications of scanning probe microscopy, images are acquired by raster scanning a point probe across a sample. Viewed from the perspective of compressed sensing (CS), this pointwise sampling scheme is inefficient, especially when the…
We present a numerical method to model electric field sensitive scanning probe microscopy measurements which allows for a tip of arbtrary shape and invokes image charges to exactly account for a sample dielectric overlayer. The method is…