Related papers: A Planar Scanning Probe Microscope
Recently, computational sampling methods have been implemented to spatially characterize terahertz (THz) fields. Previous methods usually rely on either specialized THz devices such as THz spatial light modulators, or complicated systems…
Scanning tunneling spectroscopy measures how a single electron with definite energy propagates between a sample surface and the tip of a scanning tunneling microscope. In the simplest description, the differential conductance measured is…
Near-field infrared spectroscopy by elastic scattering of light from a probe tip resolves optical contrasts in materials at dramatically sub-wavelength scales across a broad energy range, with the demonstrated capacity for chemical…
Time-resolved microscopy with the pump-probe protocol is one of the most important techniques for the investigation of dynamical processes at the nanoscale, thanks to the possibility of combining nanometric resolution imaging with…
Propagation of spoof surface plasmon polaritons (spoof SPPs) on comb-shaped ultrathin metal strips made of aluminum foil and printed copper circuit are studied experimentally and numerically. With a near field scanning technique, electric…
Fast and sensitive detector arrays enable image scanning microscopy (ISM), overcoming the trade-off between spatial resolution and signal-to-noise ratio (SNR) typical of confocal microscopy. However, current ISM approaches cannot provide…
Droplet microlasers, as promising tools for biophotonics and biomedical sciences, have witnessed rapid advances due to their flexible reconfigurability, high sensitivity to stimuli, and label-free biosensing ability. However, designing…
We present a design for a tunneling-current-assisted scanning near-field microwave microscope. For stable operation at cryogenic temperatures, making a small and rigid microwave probe is important. Our coaxial resonator probe has a length…
Structured illumination microscopy (SIM) enables live cell, super-resolution imaging at high speeds. SIM uses sophisticated optical systems to generate pre-determined excitation light patterns, and reconstruction algorithms to enhance the…
The distinction between point and line resolution in transmission electron microscopy (TEM) arises because an ability to image sub-0.2 nm fringes is a necessary, but not a sufficient, condition for imaging individual atoms. In scanned tip…
Single-atom quantum sensors offer high spatial resolution and high sensitivity to electric and magnetic fields. Among them, trapped ions offer exceptional performance in sensing electric fields, which has been used in particular to probe…
The significant optical and size benefits of using a curved focal surface for imaging systems have been well studied yet never brought to market for lack of a high-quality, mass-producible, curved image sensor. In this work we demonstrate…
Surface plasmon resonance (SPR) sensors built on photonic crystal fibers (PCFs) have recently become a promising category of optical sensing platforms. This is primarily due to their high sensitivity, compact structural design and ability…
Structured light illumination is an active 3-D scanning technique based on projecting/capturing a set of striped patterns and measuring the warping of the patterns as they reflect off a target object's surface. In the case of phase…
We present Scanning Tunneling Spectroscopy measurements at 0.1 K using tips made of Al. At zero field, the atomic lattice and charge density wave of 2HNbSe2 are observed, and under magnetic fields the peculiar electronic surface properties…
Super-resolution fluorescence microscopy is of great interest in life science studies for visualizing subcellular structures at the nanometer scale. Among various kinds of super-resolution approaches, image scanning microscopy (ISM) offers…
We propose a novel type of magnetic scanning probe sensor, based on a single planar Josephson junction with a magnetic barrier. The planar geometry together with high magnetic permeability of the barrier helps to focus flux in the junction…
Scanning tunnelling microscopy (STM) enables atomic-resolution imaging and atom manipulation, but its utility is often limited by tip degradation and slow serial data acquisition. Fabrication adds another layer of complexity since the tip…
The determination of the contact area is a key step to derive mechanical properties such as hardness or an elastic modulus by instrumented indentation testing. Two families of procedures are dedicated to extracting this area: on the one…
A simple, reliable method for preparation of bulk Cr tips for Scanning Tunneling Microscopy (STM) is proposed and its potentialities in performing high-quality and high-resolution STM and Spin Polarized-STM (SP-STM) are investigated. Cr…