We present a numerical method to model electric field sensitive scanning probe microscopy measurements which allows for a tip of arbtrary shape and invokes image charges to exactly account for a sample dielectric overlayer. The method is applied to calculate the spatial resolution of a subsurface charge accumulation imaging system, achieving reasonable agreement with experiment.
Cite
@article{arxiv.cond-mat/0309667,
title = {Modeling electric field sensitive scanning probe measurements for a tip of arbitrary shape},
author = {I. Kuljanishvili and Subhasish Chakraborty and I . J. Maasilta and S. H. Tessmer and M. R. Melloch},
journal= {arXiv preprint arXiv:cond-mat/0309667},
year = {2007}
}