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Understanding lattice deformations is crucial in determining the properties of nanomaterials, which can become more prominent in future applications ranging from energy harvesting to electronic devices. However, it remains challenging to…
The reduced dimensionality in two-dimensional materials leads a wealth of unusual properties, which are currently explored for both fundamental and applied sciences. In order to study the crystal structure, edge states, the formation of…
Here we explore the use of scanning electron diffraction coupled with electron atomic pair distribution function analysis (ePDF) to understand the local order as a function of position in a complex multicomponent system, a hot rolled,…
A suite of acquisition applications related to the 4D-STEM technique is presented as a software package written within the Digital Micrograph environment, which is a widely used software platform in worldwide electron microscopy…
Recent developments in experiments with vibrational electron energy loss spectroscopy (EELS) have revealed spectral shape variations at spatial resolutions down to sub-atomic scale. Interpretation in terms of local phonon density of states…
The ionization edges encoded in the electron energy loss spectroscopy (EELS) spectra enable advanced material analysis including composition analyses and elemental quantifications. The development of the parallel EELS instrument and fast,…
We study the band structure and scattering of in-plane coupled longitudinal and shear stress waves in linear layered media and observe that exceptional points (EP) appear for elastic (lossless) media, when parameterized with real-valued…
Probing optical excitations with high resolution is important for understanding their dynamics and controlling their interaction with other photonic elements. This can be done using state-of-the-art electron microscopes, which provide the…
Photonic extreme learning machines (PELMs) replace a digitally trained hidden layer by a fixed optical transformation, allowing a high dimensional feature map to be generated by physical propagation while only the final readout is learned.…
Low-energy electron microscopy (LEEM) is a surface science method that works primarily in the UHV environment. It provides information complementary to the other established techniques: it extends the limited view of scanning probe…
Determination of design parameters based on electromagnetic simulations of microwave circuits is an iterative and often time-consuming procedure. Space mapping is a powerful technique to optimize such complex models by efficiently…
Scanning transmission electron microscopy is a common tool used to study the atomic structure of materials. It is an inherently multimodal tool allowing for the simultaneous acquisition of multiple information channels. Despite its…
Van der Waals (vdW) materials exhibit intriguing structural, electronic and photonic properties. Electron Energy Loss Spectroscopy (EELS) within Scanning Transmission Electron Microscope (STEM) allows for nanoscale mapping of such…
This comprehensive review discusses the development of scanning electron microscopy and the application of this technology in different fields such as biology, nanobiotechnology and biomedical science. Besides being a tool for high…
Serial section electron microscopy (ssEM) is a widely used technique for obtaining volumetric information of biological tissues at nanometer scale. However, accurate 3D reconstructions of identified cellular structures and volumetric…
High-bandwidth signals are needed in many applications like radar, sensing, measurement and communications. Especially in optical networks, the sampling rate and analog bandwidth of digital-to-analog converters (DACs) is a bottleneck for…
The random equivalent sampling (RES) is a well-known sampling technique that can be used to capture a high-speed repetitive waveform with low sampling rate. In this paper, the feasibility of spectrum-blind multiband signal reconstruction…
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a…
Electron beam-induced current (EBIC) imaging in the scanning transmission electron microscope (STEM), STEM-EBIC, provides direct access to carrier transport at the nanoscale. While well established in bulk SEM geometries, its application to…
We propose a novel Graph Neural Network-based method for segmentation based on data fusion of multimodal Scanning Electron Microscope (SEM) images. In most cases, Backscattered Electron (BSE) images obtained using SEM do not contain…