Related papers: Automated approaches for band gap mapping in STEM-…
We demonstrate the feasibility of coincidence measurements in a conventional transmission electron microscope, revealing the temporal correlation between electron energy loss spectroscopy (EELS) and energy dispersive X-ray (EDX)…
Development in lattice strain mapping using four-dimensional scanning transmission electron microscopy (4D-STEM) method now offers improved precision and feasibility. However, automatic and accurate diffraction analysis is still challenging…
Single-beam scanning electron microscopes (SEM) are widely used to acquire massive data sets for biomedical study, material analysis, and fabrication inspection. Datasets are typically acquired with uniform acquisition: applying the…
Exploring the structural, chemical, and physical properties of matter on the nano- and atomic scales has become possible with the recent advances in aberration-corrected electron energy-loss spectroscopy (EELS) in scanning transmission…
Directed atomic fabrication using an aberration-corrected scanning transmission electron microscope (STEM) opens new pathways for atomic engineering of functional materials. In this approach, the electron beam is used to actively alter the…
Strain has a strong effect on the properties of materials and the performance of electronic devices. Their ever shrinking size translates into a constant demand for accurate and precise measurement methods with very high spatial resolution.…
Seeking the external equitable partitions (EEPs) of networks under unknown structures is an emerging problem in network analysis. The special structure of EEPs has found widespread applications in many fields such as cluster synchronization…
This paper investigates the problem of sampling and reconstructing bandpass signals using time encoding machine(TEM). It is shown that the sampling in principle is equivalent to periodic non-uniform sampling (PNS). Then the TEM parameters…
Metal mono-chalcogenide compounds offer a large variety of electronic properties depending on chemical composition, number of layers and stacking-order. Among them, the InSe has attracted much attention due to the promise of outstanding…
Efficient estimation of line spectral from quantized samples is of significant importance in information theory and signal processing, e.g., channel estimation in energy efficient massive MIMO systems and direction of arrival estimation.…
Strong nanoscale light-matter interaction is often accompanied by ultra-confined photonic modes and large momentum polaritons existing far beyond the light cone. A direct probe of such phenomena is difficult due to the momentum mismatch of…
The diverse spectrum of material characteristics including band gap, mechanical moduli, color, phonon and electronic density of states, along with catalytic and surface properties are intricately intertwined with the atomic structure and…
The absence of robust segmentation frameworks for noisy liquid phase transmission electron microscopy (LPTEM) videos prevents reliable extraction of particle trajectories, creating a major barrier to quantitative analysis and to connecting…
Electron energy-loss spectroscopy (EELS) is a powerful tool for imaging chemical variations at the nanoscale. Here, we investigate a polymer/organic small molecule-blend used as absorber layer in an organic solar cell and employ EELS for…
Scanning electron microscopy (SEM) has been widely utilized in the field of materials science due to its significant advantages, such as large depth of field, wide field of view, and excellent stereoscopic imaging. However, at high…
Due to the increasing demand for low power and higher sampling rates, low resolution quantization for data acquisition has drawn great attention recently. Consequently, line spectral estimation (LSE) with multiple measurement vectors (MMVs)…
As the continual experimental advances made in Electron energy loss spectroscopy (EELS) and cathodoluminescence (CL) open the door to practical exploitations of plasmonic effects in metal nanoparticles, there is an increasing need for…
Scanning Transmission Electron Microscopes (STEMs) acquire 2D images of a 3D sample on the scale of individual cell components. Unfortunately, these 2D images can be too noisy to be fused into a useful 3D structure and facilitating good…
Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher voltages. To improve resolution, spherical aberration can be…
Data acquired from multi-channel sensors is a highly valuable asset to interpret the environment for a variety of remote sensing applications. However, low spatial resolution is a critical limitation for previous sensors and the constituent…