We demonstrate the feasibility of coincidence measurements in a conventional transmission electron microscope, revealing the temporal correlation between electron energy loss spectroscopy (EELS) and energy dispersive X-ray (EDX) spectroscopy events. We make use of a delay line detector with picosecond time resolution attached to a modified EELS spectrometer. We demonstrate that coincidence between both events, related to the excitation and de-excitation of atoms in a crystal, provides added information not present in the individual EELS or EDX spectra. In particular, the method provides EELS with a significantly suppressed or even removed background, overcoming the many difficulties with conventional parametric background fitting as it uses no assumptions on the shape of the background, requires no user input and does not suffer from counting noise originating from the background signal. This is highly attractive, especially when low concentrations of elements need to be detected in a matrix of other elements.
@article{arxiv.1902.04991,
title = {Spectroscopic coincidence experiments in transmission electron microscopy},
author = {Daen Jannis and Knut Müller-Caspary and Armand Béché and Andreas Oelsner and Johan Verbeeck},
journal= {arXiv preprint arXiv:1902.04991},
year = {2019}
}
Comments
The following article has been submitted to Applied Physics Letters