A suite of acquisition applications related to the 4D-STEM technique is presented as a software package written within the Digital Micrograph environment, which is a widely used software platform in worldwide electron microscopy laboratories. The 4D-STEM technique allows the acquisition of diffraction patterns at each electron probe position in a scanning transmission electron microscope map. This suite includes 4D-STEM acquisition, ptychography, EELS/EDS spectrum imaging, tomography and basic virtual visualization and alignment methods on 4D data including incoherent differential phase contrast analysis. By integrating electron tomography with 4D-STEM and EELS SI, St4DeM enables the acquisition and analysis of 7-dimensional data.
@article{arxiv.2504.19762,
title = {St4DeM: A software suite for multi-modal 4D-STEM acquisition techniques},
author = {Toni Uusimaeki and Cheuk-Wai Tai and Tom Willhammar and Thomas Thersleff and Hasan Ali and Seda Ulusoy and Meltem Sezen and Bora Derin},
journal= {arXiv preprint arXiv:2504.19762},
year = {2025}
}