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We demonstrate the quantitative measurement of the magnetization of individual magnetic nanoparticles (MNP) using a magnetic force microscope (MFM). The quantitative measurement is realized by calibration of the MFM signal using an MNP…

Mesoscale and Nanoscale Physics · Physics 2010-02-22 Kai-Felix Braun , Sibylle Sievers , Dietmar Eberbeck , Stefan Gustafsson , Eva Olsson , Hans Werner Schumacher , Uwe Siegner

The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional…

Other Condensed Matter · Physics 2009-11-10 P. S. Fodor , H. Zhu , N. G. Patil , J. Levy

Resonant frequency modulation spectroscopy has been previously used as a highly-sensitive method for measuring the output of cold atom interferometers. Using a detailed model that accounts for optical saturation, laser intensities and…

Atomic Physics · Physics 2024-12-11 Ryan J. Thomas , Samuel R. Legge , Simon A. Haine , John D. Close

Atom probe tomography (APT) is often quoted to provide "atomic-scale" analysis of materials in three dimensions. Despite efforts to quantify APT's spatial resolution, misunderstanding remain regarding its true spatial performance. If the…

A simulation of an atomic force microscope operating in the constant amplitude dynamic mode is described. The implementation mimics the electronics of a real setup including a digital phase-locked loop (PLL). The PLL is not only used as a…

Atomic and Molecular Clusters · Physics 2007-05-23 Laurent Nony , Alexis Prof. Baratoff , Dominique Schaer , Oliver Pfeiffer , Adrian Wezel , Ernst Meyer

Resolving frequencies in a time-dependent field is classically limited by the measurement bandwidth. Using tools from quantum metrology and quantum control may overcome this limit, yet the full advantage afforded by entanglement so far…

Quantum Physics · Physics 2025-09-03 Anirban Dey , Sara Mouradian , Cosmo Lupo , Zixin Huang

Ultrafast Electron Microscopy (UEM) has been demonstrated to be an effective table-top technique for imaging the temporally-evolving dynamics of matter with subparticle spatial resolution on the time scale of atomic motion. However, imaging…

Optics · Physics 2017-08-02 M. Th. Hassan , J. S. Baskin , B. Liao , A. H. Zewail

The local work function of a surface determines the spatial decay of the charge density at the Fermi level normal to the surface. Here, we present a method that enables simultaneous measurements of local work function and tip-sample forces.…

Materials Science · Physics 2007-05-23 M. Herz , Ch. Schiller , F. J. Giessibl , J. Mannhart

We study relaxation of a spin in magnetic resonance force microscopy (MRFM) experiments. We evaluate the relaxation rate for the spin caused by high-frequency mechanical noise of the cantilever under the conditions of adiabatic spin…

Mesoscale and Nanoscale Physics · Physics 2009-11-07 D. Mozyrsky , I. Martin , D. Pelekhov , P. C. Hammel

A dual-excitation method for resonant-frequency tracking in scanning probe microscopy based on amplitude detection is developed. This method allows the cantilever to be operated at or near resonance for techniques where standard phase…

Materials Science · Physics 2008-03-13 B J Rodriguez , C Callahan , S V Kalinin , R Proksch

In order to develop a new structure microwave probe, the fabrication of AFM probe on the GaAs wafer was studied. A waveguide was introduced by evaporating Au film on the top and bottom surfaces of the GaAs AFM probe. A tip having 8…

Other Computer Science · Computer Science 2008-12-18 Y. Ju , M. Hamada , T. Kobayashi , H. Soyama

Torsional harmonic cantilevers allow measurement of time varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate…

Instrumentation and Detectors · Physics 2008-11-26 Ozgur Sahin

Fast and broadband spectrum sensing is an essential component in cognitive radio systems, intelligent transportation systems, electronic warfare systems, etc. However, traditional electronic-based solutions have a trade-off among the…

Advancing temporal resolution in computation, signal modulation, and measurement is crucial for pushing the frontiers of modern science and technology. Optical resonators have recently demonstrated computational operations at frequencies…

Optics · Physics 2025-10-31 Asaf Farhi

Kelvin probe force microscopy (KPFM) adapts an atomic force microscope to measure electric potential on surfaces at nanometer length scales. Here we demonstrate that Heterodyne-KPFM enables scan rates of several frames per minute in air,…

Mesoscale and Nanoscale Physics · Physics 2016-06-22 Joseph L. Garrett , Jeremy N. Munday

Dispersive Fourier transformation is a powerful technique in which spectral information is mapped into the time domain using chromatic dispersion. It replaces a spectrometer with an electronic digitizer, and enables real-time spectroscopy.…

Optics · Physics 2009-11-13 J. Chou , D. R. Solli , B. Jalali

Quantum simulations with ultracold atoms typically create atomic wavefunctions with structures at optical length scales, where direct imaging suffers from the diffraction limit. In analogy to advances in optical microscopy for biological…

Quantum Gases · Physics 2019-04-10 Sarthak Subhankar , Yang Wang , Tsz-Chun Tsui , Steven L. Rolston , James V. Porto

Recent advances in mechanical-diode based ultrasonic force microscopy techniques are reviewed. The potential of Ultrasonic Force Microscopy (UFM) for the study of material elastic properties is explained in detail. Advantages of the…

Applied Physics · Physics 2019-01-23 M. Teresa Cuberes

Weak measurement (WM) with state pre- and post-selection can amplify otherwise undetectable small signals and thus promise great potentials in precision measurements. Although frequency measurements offer the hitherto highest precision…

Atomic Physics · Physics 2018-12-10 Weizhi Qu , Jian Sun , Shenchao Jin , Liang Jiang , Jianming Wen , Yanhong Xiao

We find that the jump-into-contact of the cantilever in the atomic force microscope (AFM) is caused by an inherent instability in the motion of the AFM cantilever. The analysis is based on a simple model of the cantilever moving in a…

Materials Science · Physics 2008-10-20 Soma Das , P. A. Sreeram , A. K. Raychaudhuri